Vai al contenuto principale della pagina

Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy



(Visualizza in formato marc)    (Visualizza in BIBFRAME)

Autore: Joy David C. <1943-> Visualizza persona
Titolo: Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy Visualizza cluster
Pubblicazione: New York, : Oxford University Press, 1995
Edizione: 1st ed.
Descrizione fisica: 1 online resource (225 p.)
Disciplina: 502/.8/25
Soggetto topico: Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation
Monte Carlo method
Note generali: Previously issued in print: 1995.
Nota di bibliografia: Includes bibliographical references.
Nota di contenuto: Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index
Sommario/riassunto: 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
Titolo autorizzato: Monte Carlo modeling for electron microscopy and microanalysis  Visualizza cluster
ISBN: 0-19-773242-9
1-280-53489-3
9786610534890
0-19-535846-5
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910808190203321
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Serie: Oxford series in optical and imaging sciences ; ; 9.