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Record Nr. |
UNINA9910808190203321 |
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Autore |
Joy David C. <1943-> |
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Titolo |
Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy |
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Pubbl/distr/stampa |
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New York, : Oxford University Press, 1995 |
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ISBN |
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0-19-773242-9 |
1-280-53489-3 |
9786610534890 |
0-19-535846-5 |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (225 p.) |
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Collana |
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Oxford series in optical and imaging sciences ; ; 9 |
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Disciplina |
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Soggetti |
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Electron microscopy - Computer simulation |
Electron probe microanalysis - Computer simulation |
Monte Carlo method |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Previously issued in print: 1995. |
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Nota di bibliografia |
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Includes bibliographical references. |
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Nota di contenuto |
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Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
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Sommario/riassunto |
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1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? |
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