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100   $a19940915d1995      uy         0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 10$aMonte Carlo modeling for electron microscopy and microanalysis /$fDavid C. Joy
205   $a1st ed.
210   $aNew York $cOxford University Press$d1995
215   $a1 online resource (225 p.)
225 1 $aOxford series in optical and imaging sciences ;$v9
300   $aPreviously issued in print: 1995.
311   $a0-19-508874-3 
320   $aIncludes bibliographical references.
327   $aContents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index
330   $a1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
410  0$aOxford series in optical and imaging sciences ;$v9.
606   $aElectron microscopy$xComputer simulation
606   $aElectron probe microanalysis$xComputer simulation
606   $aMonte Carlo method
615  0$aElectron microscopy$xComputer simulation.
615  0$aElectron probe microanalysis$xComputer simulation.
615  0$aMonte Carlo method.
676   $a502/.8/25
700   $aJoy$b David C.$f1943-$01669377
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910808190203321
996   $aMonte Carlo modeling for electron microscopy and microanalysis$94030508
997   $aUNINA