Metrology and Physical Mechanisms in New Generation Ionic Devices / / by Umberto Celano
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| Autore: |
Celano Umberto
|
| Titolo: |
Metrology and Physical Mechanisms in New Generation Ionic Devices / / by Umberto Celano
|
| Pubblicazione: | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Edizione: | 1st ed. 2016. |
| Descrizione fisica: | 1 online resource (XXIV, 175 p. 96 illus., 18 illus. in color.) |
| Disciplina: | 621.38152 |
| Soggetto topico: | Spectroscopy |
| Microscopy | |
| Nanotechnology | |
| Materials science | |
| Spectroscopy and Microscopy | |
| Nanotechnology and Microengineering | |
| Characterization and Evaluation of Materials | |
| Nota di bibliografia: | Includes bibliographical references. |
| Nota di contenuto: | Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. . |
| Sommario/riassunto: | The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. . |
| Titolo autorizzato: | Metrology and Physical Mechanisms in New Generation Ionic Devices |
| ISBN: | 3-319-39531-9 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910254620403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Springer Theses, Recognizing Outstanding Ph.D. Research, . 2190-5053