03047nam 22006015 450 991025462040332120200702132838.03-319-39531-910.1007/978-3-319-39531-9(CKB)3710000000732223(DE-He213)978-3-319-39531-9(MiAaPQ)EBC4560582(PPN)194379574(EXLCZ)99371000000073222320160618d2016 u| 0engurnn|008mamaatxtrdacontentcrdamediacrrdacarrierMetrology and Physical Mechanisms in New Generation Ionic Devices /by Umberto Celano1st ed. 2016.Cham :Springer International Publishing :Imprint: Springer,2016.1 online resource (XXIV, 175 p. 96 illus., 18 illus. in color.) Springer Theses, Recognizing Outstanding Ph.D. Research,2190-50533-319-39530-0 Includes bibliographical references.Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053SpectroscopyMicroscopyNanotechnologyMaterials scienceSpectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Nanotechnology and Microengineeringhttps://scigraph.springernature.com/ontologies/product-market-codes/T18000Characterization and Evaluation of Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z17000Spectroscopy.Microscopy.Nanotechnology.Materials science.Spectroscopy and Microscopy.Nanotechnology and Microengineering.Characterization and Evaluation of Materials.621.38152Celano Umbertoauthttp://id.loc.gov/vocabulary/relators/aut805582MiAaPQMiAaPQMiAaPQBOOK9910254620403321Metrology and Physical Mechanisms in New Generation Ionic Devices1808132UNINA