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010   $a3-319-39531-9
024 7 $a10.1007/978-3-319-39531-9
035   $a(CKB)3710000000732223
035   $a(DE-He213)978-3-319-39531-9
035   $a(MiAaPQ)EBC4560582
035   $a(PPN)194379574
035   $a(EXLCZ)993710000000732223
100   $a20160618d2016      u|         0
101 0 $aeng
135   $aurnn|008mamaa
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aMetrology and Physical Mechanisms in New Generation Ionic Devices /$fby Umberto Celano
205   $a1st ed. 2016.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2016.
215   $a1 online resource (XXIV, 175 p. 96 illus., 18 illus. in color.) 
225 1 $aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053
311   $a3-319-39530-0 
320   $aIncludes bibliographical references.
327   $aIntroduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .
330   $aThe thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
410  0$aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053
606   $aSpectroscopy
606   $aMicroscopy
606   $aNanotechnology
606   $aMaterials science
606   $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090
606   $aNanotechnology and Microengineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T18000
606   $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
615  0$aSpectroscopy.
615  0$aMicroscopy.
615  0$aNanotechnology.
615  0$aMaterials science.
615 14$aSpectroscopy and Microscopy.
615 24$aNanotechnology and Microengineering.
615 24$aCharacterization and Evaluation of Materials.
676   $a621.38152
700   $aCelano$b Umberto$4aut$4http://id.loc.gov/vocabulary/relators/aut$0805582
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910254620403321
996   $aMetrology and Physical Mechanisms in New Generation Ionic Devices$91808132
997   $aUNINA