Methods of measurement for semiconductor materials, process control, and devices : quarterly report October 1 to December 31, 1970 / / W. Murray Bullis

• Autore: Bullis W. Murray
• Pubblicazione: Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971
• Descrizione fisica: 1 online resource
• Altri autori: BullisW. Murray
• Note generali: 1971.; Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.; Title from PDF title page.
• Nota di bibliografia: Includes bibliographical references.
• Altri titoli varianti: Methods of measurement for semiconductor materials, process control, and devices
• Titolo autorizzato: Methods of measurement for semiconductor materials, process control, and devices
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910711390603321
• Lo trovi qui: Univ. Federico II