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A FORTRAN program for calculating the electrical parameters of extrinsic silicon
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Evolution of silicon materials characterization
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Methods of measurement for semiconductor materials, process control, and devices
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Methods of measurement for semiconductor materials, process control, and devices quarterly report
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Methods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969
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Methods of measurement for semiconductor materials, process control, and devices, quarterly report, January 1 to March 31, 1969
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Methods of measurement for semiconductor materials, process control, and devices, quarterly report, October 1 to December 31, 1968
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Resistivity and carrier lifetime in gold-doped silicon
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Semiconductor technology program
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Standard measurements of the resistivity of silicon by the four-probe method
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Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
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The NBS semiconductor technology program and VLSI
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