Challenges and New Trends in Power Electronic Devices Reliability

• Autore: Falco Pasquale De
• Pubblicazione: Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
• Descrizione fisica: 1 online resource (207 p.)
• Soggetto topico: Energy industries & utilities; Technology: general issues
• Soggetto non controllato: AC motor drive; AC-coupled configuration; accelerated test; AlGaN/GaN HEMT; availability; battery; bond wire; cables; capacitors; cascode structure; condition monitoring; cracks; current harmonics; DC-coupled configuration; DC/AC converter; electromagnetic launching field; failure monitoring; fusion algorithm; heavy-ion irradiation experiment; high-light mode; high-power thyristors; IGBT reliability; junction temperature; LED; lifetime prediction; loss modeling; low-light mode; maintenance; microgrid inverter; mission profile; module transconductance; multi-chip IGBT module; n/a; online evaluation; photovoltaic system; photovoltaic systems; power device; power electronic converters; power electronics; power MOSFET; power system faults; PPS; reliability; reverse recovery currents; segmented LSTM; sensor lamp; SiC MOSFET; single event effects; solder joint; technology computer-aided design simulation; temperature calibration; thermal cycling test; voltage harmonics
• Persona (resp. second.): ChiodoElio; Di NoiaLuigi Pio; FalcoPasquale De
• Sommario/riassunto: The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components.
• Titolo autorizzato: Challenges and New Trends in Power Electronic Devices Reliability
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910674042803321
• Lo trovi qui: Univ. Federico II