LEADER 04046nam  2201045z- 450 
001 9910674042803321
005 20220111
035   $a(CKB)5400000000042729
035   $a(oapen)https://directory.doabooks.org/handle/20.500.12854/76306
035   $a(oapen)doab76306
035   $a(EXLCZ)995400000000042729
100   $a20202201d2021      |y         0
101 0 $aeng
135   $aurmn|---annan
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aChallenges and New Trends in Power Electronic Devices Reliability
210   $aBasel, Switzerland$cMDPI - Multidisciplinary Digital Publishing Institute$d2021
215   $a1 online resource (207 p.)
311 08$a3-0365-1177-6 
311 08$a3-0365-1176-8 
330   $aThe rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components.
606   $aEnergy industries & utilities$2bicssc
606   $aTechnology: general issues$2bicssc
610   $aAC motor drive
610   $aAC-coupled configuration
610   $aaccelerated test
610   $aAlGaN/GaN HEMT
610   $aavailability
610   $abattery
610   $abond wire
610   $acables
610   $acapacitors
610   $acascode structure
610   $acondition monitoring
610   $acracks
610   $acurrent harmonics
610   $aDC-coupled configuration
610   $aDC/AC converter
610   $aelectromagnetic launching field
610   $afailure monitoring
610   $afusion algorithm
610   $aheavy-ion irradiation experiment
610   $ahigh-light mode
610   $ahigh-power thyristors
610   $aIGBT reliability
610   $ajunction temperature
610   $aLED
610   $alifetime prediction
610   $aloss modeling
610   $alow-light mode
610   $amaintenance
610   $amicrogrid inverter
610   $amission profile
610   $amodule transconductance
610   $amulti-chip IGBT module
610   $an/a
610   $aonline evaluation
610   $aphotovoltaic system
610   $aphotovoltaic systems
610   $apower device
610   $apower electronic converters
610   $apower electronics
610   $apower MOSFET
610   $apower system faults
610   $aPPS
610   $areliability
610   $areverse recovery currents
610   $asegmented LSTM
610   $asensor lamp
610   $aSiC MOSFET
610   $asingle event effects
610   $asolder joint
610   $atechnology computer-aided design simulation
610   $atemperature calibration
610   $athermal cycling test
610   $avoltage harmonics
615  7$aEnergy industries & utilities
615  7$aTechnology: general issues
700   $aFalco$b Pasquale De$4edt$01339012
702   $aChiodo$b Elio$4edt
702   $aDi Noia$b Luigi Pio$4edt
702   $aFalco$b Pasquale De$4oth
702   $aChiodo$b Elio$4oth
702   $aDi Noia$b Luigi Pio$4oth
906   $aBOOK
912   $a9910674042803321
996   $aChallenges and New Trends in Power Electronic Devices Reliability$93059509
997   $aUNINA