LEADER 02732nam 22006374a 450 001 9910782027803321 005 20230207225552.0 010 $a1-59213-458-0 010 $a1-59213-786-5 035 $a(CKB)1000000000522949 035 $a(EBL)951124 035 $a(OCoLC)806203265 035 $a(SSID)ssj0000282532 035 $a(PQKBManifestationID)11227694 035 $a(PQKBTitleCode)TC0000282532 035 $a(PQKBWorkID)10317053 035 $a(PQKB)10272968 035 $a(MiAaPQ)EBC951124 035 $a(Au-PeEL)EBL951124 035 $a(CaPaEBR)ebr10182525 035 $a(CaONFJC)MIL514667 035 $a(EXLCZ)991000000000522949 100 $a20050527d2006 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aOrdinary poverty$b[electronic resource] $ea little food and cold storage /$fWilliam DiFazio 210 $aPhiladelphia, PA $cTemple University Press$d2006 215 $a1 online resource (233 p.) 225 1 $aLabor in crisis 300 $aDescription based upon print version of record. 311 $a1-299-83416-7 311 $a1-59213-014-3 320 $aIncludes bibliographical references (p. 195-209) and index. 327 $aContents; Acknowledgments; 1 Introduction: Ordinary Poverty; 2 Soup Kitchen Blues: 1988-1993; 3 Beggars Can't Be Choosers: 1993-2000; 4 The Dialectic of Sister Bernadette: The Limits of Advocacy; 5 Forgetting Poverty: A Seder for Everyone; 6 Conclusion: Making Poverty Extraordinary; Notes; Index 330 $aAt St. John's Bread and Life, a soup kitchen in the Bedford-Stuyvesant section of Brooklyn, more than a thousand people line up for breakfast and lunch five days a week. During the twelve-year era of welfare reform, William DiFazio observed the daily lives of poor people at St. John's and throughout New York City. In this trenchant and groundbreaking work, DiFazio presents the results of welfare reform-from ending entitlements to diminished welfare benefits-through the eyes and voices of those who were most directly affected by it. Ordinary Poverty concludes with a program 410 0$aLabor in crisis. 606 $aPoverty$zUnited States 606 $aPoor$zUnited States$vCase studies 606 $aSocial justice$zUnited States 607 $aUnited States$xEconomic policy 607 $aUnited States$xSocial policy 615 0$aPoverty 615 0$aPoor 615 0$aSocial justice 676 $a362.5/0973 700 $aDiFazio$b William$01521684 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910782027803321 996 $aOrdinary poverty$93806682 997 $aUNINA LEADER 04046nam 2201045z- 450 001 9910674042803321 005 20220111 035 $a(CKB)5400000000042729 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/76306 035 $a(oapen)doab76306 035 $a(EXLCZ)995400000000042729 100 $a20202201d2021 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aChallenges and New Trends in Power Electronic Devices Reliability 210 $aBasel, Switzerland$cMDPI - Multidisciplinary Digital Publishing Institute$d2021 215 $a1 online resource (207 p.) 311 08$a3-0365-1177-6 311 08$a3-0365-1176-8 330 $aThe rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components. 606 $aEnergy industries & utilities$2bicssc 606 $aTechnology: general issues$2bicssc 610 $aAC motor drive 610 $aAC-coupled configuration 610 $aaccelerated test 610 $aAlGaN/GaN HEMT 610 $aavailability 610 $abattery 610 $abond wire 610 $acables 610 $acapacitors 610 $acascode structure 610 $acondition monitoring 610 $acracks 610 $acurrent harmonics 610 $aDC-coupled configuration 610 $aDC/AC converter 610 $aelectromagnetic launching field 610 $afailure monitoring 610 $afusion algorithm 610 $aheavy-ion irradiation experiment 610 $ahigh-light mode 610 $ahigh-power thyristors 610 $aIGBT reliability 610 $ajunction temperature 610 $aLED 610 $alifetime prediction 610 $aloss modeling 610 $alow-light mode 610 $amaintenance 610 $amicrogrid inverter 610 $amission profile 610 $amodule transconductance 610 $amulti-chip IGBT module 610 $an/a 610 $aonline evaluation 610 $aphotovoltaic system 610 $aphotovoltaic systems 610 $apower device 610 $apower electronic converters 610 $apower electronics 610 $apower MOSFET 610 $apower system faults 610 $aPPS 610 $areliability 610 $areverse recovery currents 610 $asegmented LSTM 610 $asensor lamp 610 $aSiC MOSFET 610 $asingle event effects 610 $asolder joint 610 $atechnology computer-aided design simulation 610 $atemperature calibration 610 $athermal cycling test 610 $avoltage harmonics 615 7$aEnergy industries & utilities 615 7$aTechnology: general issues 700 $aFalco$b Pasquale De$4edt$01339012 702 $aChiodo$b Elio$4edt 702 $aDi Noia$b Luigi Pio$4edt 702 $aFalco$b Pasquale De$4oth 702 $aChiodo$b Elio$4oth 702 $aDi Noia$b Luigi Pio$4oth 906 $aBOOK 912 $a9910674042803321 996 $aChallenges and New Trends in Power Electronic Devices Reliability$93059509 997 $aUNINA