04046nam 2201045z- 450 991067404280332120220111(CKB)5400000000042729(oapen)https://directory.doabooks.org/handle/20.500.12854/76306(oapen)doab76306(EXLCZ)99540000000004272920202201d2021 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierChallenges and New Trends in Power Electronic Devices ReliabilityBasel, SwitzerlandMDPI - Multidisciplinary Digital Publishing Institute20211 online resource (207 p.)3-0365-1177-6 3-0365-1176-8 The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components.Energy industries & utilitiesbicsscTechnology: general issuesbicsscAC motor driveAC-coupled configurationaccelerated testAlGaN/GaN HEMTavailabilitybatterybond wirecablescapacitorscascode structurecondition monitoringcrackscurrent harmonicsDC-coupled configurationDC/AC converterelectromagnetic launching fieldfailure monitoringfusion algorithmheavy-ion irradiation experimenthigh-light modehigh-power thyristorsIGBT reliabilityjunction temperatureLEDlifetime predictionloss modelinglow-light modemaintenancemicrogrid invertermission profilemodule transconductancemulti-chip IGBT modulen/aonline evaluationphotovoltaic systemphotovoltaic systemspower devicepower electronic converterspower electronicspower MOSFETpower system faultsPPSreliabilityreverse recovery currentssegmented LSTMsensor lampSiC MOSFETsingle event effectssolder jointtechnology computer-aided design simulationtemperature calibrationthermal cycling testvoltage harmonicsEnergy industries & utilitiesTechnology: general issuesFalco Pasquale Deedt1339012Chiodo ElioedtDi Noia Luigi PioedtFalco Pasquale DeothChiodo ElioothDi Noia Luigi PioothBOOK9910674042803321Challenges and New Trends in Power Electronic Devices Reliability3059509UNINA