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Manufacturing Metrology



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Autore: Fan Kuang-Chao Visualizza persona
Titolo: Manufacturing Metrology Visualizza cluster
Pubblicazione: Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica: 1 electronic resource (414 p.)
Soggetto topico: Technology: general issues
History of engineering & technology
Soggetto non controllato: white light interference
laser interference
surface positioning
end-plate surface distance measurement
spherical diamond wheel
diamond roller
form truing
in-situ measurements
topography measurement
differential measurement system
modular design
confocal sensor
film interferometry
over-constrained mechanism
geometric deviations
multi-tasking machine tools
identification method
squareness of translational axes
metrology
step gauge
length calibration
multi-path laser synthesis technology
measurement mechanism
machine tool
surface shape contour
on-site measurement
positional relation
scanless 3D imaging
compressed sensing
depth detection
single-pixel detector
blade tip timing
circumferential Fourier fit
synchronous vibration
optical angle sensor
mode-locked femtosecond laser
optical frequency comb
laser autocollimation
diffraction grating
absolute angle measurement
nonlinear optics
second harmonic generation
aeroengine blade
blade twist
measurement and evaluation
a priori planning
geometric analysis
automated optical inspection
precision measurement
circular contour
edge detection
measurement system analysis
coordinate measuring machine
reproducibility
GD&amp
T
quality
measurement uncertainty
precision metrology
form measurement
stitching linear-scan method
roundness measurement
Monte Carlo method
single point diamond tool
cutting edge radius
reversal method
nanoindentation system
elastic recovery
surface charge distribution
point probing characteristics
spherical scattering electrical field probe
miniature internal structures
high aspect ratios
circulating cooling water
dynamic thermal filtering
precision manufacturing
quick response
temperature stability
thermal management
dual-axis level
light refraction
light transmission
angle measurement
differential Fabry-Pérot interferometer
homodyne interferometer
nonlinearity error
linear displacement
chromatic confocal probe
femtosecond laser
off-axis differential method
tracking local minimum method
laser triangulation displacement sensor (LTDS)
dispensing robot
location system
actual laser imaging waveform
centroid difference
repeatability accuracy
dynamic response speed
absolute distance measurement
system error correction
surface texture measurement
confocal sensing
surface form tracing
3D reconstruction
roughness
in-process
metrology for machining
optical coherence tomography
wafer die
defect detection
generative adversarial network (GAN)
you only look once version 3 (YOLOv3)
pad dressing
dynamic measurement
CMP
pad uniformity
pad lifetime
Persona (resp. second.): KinnellPeter
FanKuang-Chao
Sommario/riassunto: Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.
Titolo autorizzato: Manufacturing Metrology  Visualizza cluster
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910580211003321
Lo trovi qui: Univ. Federico II
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