LEADER 07101nam 2201777z- 450 001 9910580211003321 005 20231214132944.0 035 $a(CKB)5690000000011978 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/87414 035 $a(EXLCZ)995690000000011978 100 $a20202207d2022 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aManufacturing Metrology 210 $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022 215 $a1 electronic resource (414 p.) 311 $a3-0365-2986-1 311 $a3-0365-2987-X 330 $aMetrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation. 606 $aTechnology: general issues$2bicssc 606 $aHistory of engineering & technology$2bicssc 610 $awhite light interference 610 $alaser interference 610 $asurface positioning 610 $aend-plate surface distance measurement 610 $aspherical diamond wheel 610 $adiamond roller 610 $aform truing 610 $ain-situ measurements 610 $atopography measurement 610 $adifferential measurement system 610 $amodular design 610 $aconfocal sensor 610 $afilm interferometry 610 $aover-constrained mechanism 610 $ageometric deviations 610 $amulti-tasking machine tools 610 $aidentification method 610 $asquareness of translational axes 610 $ametrology 610 $astep gauge 610 $alength calibration 610 $amulti-path laser synthesis technology 610 $ameasurement mechanism 610 $amachine tool 610 $asurface shape contour 610 $aon-site measurement 610 $apositional relation 610 $ascanless 3D imaging 610 $acompressed sensing 610 $adepth detection 610 $asingle-pixel detector 610 $ablade tip timing 610 $acircumferential Fourier fit 610 $asynchronous vibration 610 $aoptical angle sensor 610 $amode-locked femtosecond laser 610 $aoptical frequency comb 610 $alaser autocollimation 610 $adiffraction grating 610 $aabsolute angle measurement 610 $anonlinear optics 610 $asecond harmonic generation 610 $aaeroengine blade 610 $ablade twist 610 $ameasurement and evaluation 610 $aa priori planning 610 $ageometric analysis 610 $aautomated optical inspection 610 $aprecision measurement 610 $acircular contour 610 $aedge detection 610 $ameasurement system analysis 610 $acoordinate measuring machine 610 $areproducibility 610 $aGD& 610 $aT 610 $aquality 610 $ameasurement uncertainty 610 $aprecision metrology 610 $aform measurement 610 $astitching linear-scan method 610 $aroundness measurement 610 $aMonte Carlo method 610 $asingle point diamond tool 610 $acutting edge radius 610 $areversal method 610 $ananoindentation system 610 $aelastic recovery 610 $asurface charge distribution 610 $apoint probing characteristics 610 $aspherical scattering electrical field probe 610 $aminiature internal structures 610 $ahigh aspect ratios 610 $acirculating cooling water 610 $adynamic thermal filtering 610 $aprecision manufacturing 610 $aquick response 610 $atemperature stability 610 $athermal management 610 $adual-axis level 610 $alight refraction 610 $alight transmission 610 $aangle measurement 610 $adifferential Fabry-Pe?rot interferometer 610 $ahomodyne interferometer 610 $anonlinearity error 610 $alinear displacement 610 $achromatic confocal probe 610 $afemtosecond laser 610 $aoff-axis differential method 610 $atracking local minimum method 610 $alaser triangulation displacement sensor (LTDS) 610 $adispensing robot 610 $alocation system 610 $aactual laser imaging waveform 610 $acentroid difference 610 $arepeatability accuracy 610 $adynamic response speed 610 $aabsolute distance measurement 610 $asystem error correction 610 $asurface texture measurement 610 $aconfocal sensing 610 $asurface form tracing 610 $a3D reconstruction 610 $aroughness 610 $ain-process 610 $ametrology for machining 610 $aoptical coherence tomography 610 $awafer die 610 $adefect detection 610 $agenerative adversarial network (GAN) 610 $ayou only look once version 3 (YOLOv3) 610 $apad dressing 610 $adynamic measurement 610 $aCMP 610 $apad uniformity 610 $apad lifetime 615 7$aTechnology: general issues 615 7$aHistory of engineering & technology 700 $aFan$b Kuang-Chao$4edt$01297585 702 $aKinnell$b Peter$4edt 702 $aFan$b Kuang-Chao$4oth 702 $aKinnell$b Peter$4oth 906 $aBOOK 912 $a9910580211003321 996 $aManufacturing Metrology$93024577 997 $aUNINA