07138nam 2201801z- 450 991058021100332120220706(CKB)5690000000011978(oapen)https://directory.doabooks.org/handle/20.500.12854/87414(oapen)doab87414(EXLCZ)99569000000001197820202207d2022 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierManufacturing MetrologyBaselMDPI - Multidisciplinary Digital Publishing Institute20221 online resource (414 p.)3-0365-2986-1 3-0365-2987-X Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.History of engineering & technologybicsscTechnology: general issuesbicssc3D reconstructiona priori planningabsolute angle measurementabsolute distance measurementactual laser imaging waveformaeroengine bladeangle measurementautomated optical inspectionblade tip timingblade twistcentroid differencechromatic confocal probecircular contourcirculating cooling watercircumferential Fourier fitCMPcompressed sensingconfocal sensingconfocal sensorcoordinate measuring machinecutting edge radiusdefect detectiondepth detectiondiamond rollerdifferential Fabry-Pérot interferometerdifferential measurement systemdiffraction gratingdispensing robotdual-axis leveldynamic measurementdynamic response speeddynamic thermal filteringedge detectionelastic recoveryend-plate surface distance measurementfemtosecond laserfilm interferometryform measurementform truingGD&ampgenerative adversarial network (GAN)geometric analysisgeometric deviationshigh aspect ratioshomodyne interferometeridentification methodin-processin-situ measurementslaser autocollimationlaser interferencelaser triangulation displacement sensor (LTDS)length calibrationlight refractionlight transmissionlinear displacementlocation systemmachine toolmeasurement and evaluationmeasurement mechanismmeasurement system analysismeasurement uncertaintymetrologymetrology for machiningminiature internal structuresmode-locked femtosecond lasermodular designMonte Carlo methodmulti-path laser synthesis technologymulti-tasking machine toolsn/ananoindentation systemnonlinear opticsnonlinearity erroroff-axis differential methodon-site measurementoptical angle sensoroptical coherence tomographyoptical frequency combover-constrained mechanismpad dressingpad lifetimepad uniformitypoint probing characteristicspositional relationprecision manufacturingprecision measurementprecision metrologyqualityquick responserepeatability accuracyreproducibilityreversal methodroughnessroundness measurementscanless 3D imagingsecond harmonic generationsingle point diamond toolsingle-pixel detectorspherical diamond wheelspherical scattering electrical field probesquareness of translational axesstep gaugestitching linear-scan methodsurface charge distributionsurface form tracingsurface positioningsurface shape contoursurface texture measurementsynchronous vibrationsystem error correctionTtemperature stabilitythermal managementtopography measurementtracking local minimum methodwafer diewhite light interferenceyou only look once version 3 (YOLOv3)History of engineering & technologyTechnology: general issuesFan Kuang-Chaoedt1297585Kinnell PeteredtFan Kuang-ChaoothKinnell PeterothBOOK9910580211003321Manufacturing Metrology3024577UNINA