07101nam 2201777z- 450 991058021100332120231214132944.0(CKB)5690000000011978(oapen)https://directory.doabooks.org/handle/20.500.12854/87414(EXLCZ)99569000000001197820202207d2022 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierManufacturing MetrologyBaselMDPI - Multidisciplinary Digital Publishing Institute20221 electronic resource (414 p.)3-0365-2986-1 3-0365-2987-X Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.Technology: general issuesbicsscHistory of engineering & technologybicsscwhite light interferencelaser interferencesurface positioningend-plate surface distance measurementspherical diamond wheeldiamond rollerform truingin-situ measurementstopography measurementdifferential measurement systemmodular designconfocal sensorfilm interferometryover-constrained mechanismgeometric deviationsmulti-tasking machine toolsidentification methodsquareness of translational axesmetrologystep gaugelength calibrationmulti-path laser synthesis technologymeasurement mechanismmachine toolsurface shape contouron-site measurementpositional relationscanless 3D imagingcompressed sensingdepth detectionsingle-pixel detectorblade tip timingcircumferential Fourier fitsynchronous vibrationoptical angle sensormode-locked femtosecond laseroptical frequency comblaser autocollimationdiffraction gratingabsolute angle measurementnonlinear opticssecond harmonic generationaeroengine bladeblade twistmeasurement and evaluationa priori planninggeometric analysisautomated optical inspectionprecision measurementcircular contouredge detectionmeasurement system analysiscoordinate measuring machinereproducibilityGD&ampTqualitymeasurement uncertaintyprecision metrologyform measurementstitching linear-scan methodroundness measurementMonte Carlo methodsingle point diamond toolcutting edge radiusreversal methodnanoindentation systemelastic recoverysurface charge distributionpoint probing characteristicsspherical scattering electrical field probeminiature internal structureshigh aspect ratioscirculating cooling waterdynamic thermal filteringprecision manufacturingquick responsetemperature stabilitythermal managementdual-axis levellight refractionlight transmissionangle measurementdifferential Fabry-Pérot interferometerhomodyne interferometernonlinearity errorlinear displacementchromatic confocal probefemtosecond laseroff-axis differential methodtracking local minimum methodlaser triangulation displacement sensor (LTDS)dispensing robotlocation systemactual laser imaging waveformcentroid differencerepeatability accuracydynamic response speedabsolute distance measurementsystem error correctionsurface texture measurementconfocal sensingsurface form tracing3D reconstructionroughnessin-processmetrology for machiningoptical coherence tomographywafer diedefect detectiongenerative adversarial network (GAN)you only look once version 3 (YOLOv3)pad dressingdynamic measurementCMPpad uniformitypad lifetimeTechnology: general issuesHistory of engineering & technologyFan Kuang-Chaoedt1297585Kinnell PeteredtFan Kuang-ChaoothKinnell PeterothBOOK9910580211003321Manufacturing Metrology3024577UNINA