Photonic Technology for Precision Metrology

• Autore: Wojtas Jacek
• Pubblicazione: Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
• Descrizione fisica: 1 online resource (126 p.)
• Soggetto topico: History of engineering & technology; Technology: general issues
• Soggetto non controllato: 2D material photodetectors; absorption spectroscopy; accuracy; ammonia detection; BLIP condition; CEAS; chopper stabilised op-amp; colloidal quantum dot photodetectors; CRDS; deep learning; displacement measuring interferometer; electro-optic modulator; fibreoptic coupling; fluorescence microscopy; fourier ptychography; free space optics; frequency modulation; FTIR; gas sensors; HgCdTe; HOT IR detectors; hybrid photodetector (HPD); image classification; indium arsenide antimony photodiode; infrared modulator; infrared thermometer; laser absorption spectroscopy; laser controller; laser spectroscopy; low-light photodetectors; mid-wave infrared; MOX sensors; MUPASS; neural network; NH3; optoelectronic sensors; P-i-N; PAS; photonic metrology; polymer sensors; precision; quantum cascade laser; resolution; single-molecule fluorescence detection; time-resolved fluorescence microscopy; uncooled thermometer; zero-drift pre-amplifier
• Persona (resp. second.): WojtasJacek
• Sommario/riassunto: Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon-matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared range. Since the invention of the laser, a source of highly coherent optical radiation, optical measurements have become the perfect tool for highly precise and accurate measurements. Such measurements have the additional advantages of requiring no contact and a fast rate suitable for in-process metrology. However, their extreme precision is ultimately limited by, e.g., the noise of both lasers and photodetectors. The Special Issue of the Applied Science is devoted to the cutting-edge uses of optical sources, detectors, and optoelectronics systems in numerous fields of science and technology (e.g., industry, environment, healthcare, telecommunication, security, and space). The aim is to provide detail on state-of-the-art photonic technology for precision metrology and identify future developmental directions. This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems.
• Titolo autorizzato: Photonic Technology for Precision Metrology
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910585938003321
• Lo trovi qui: Univ. Federico II