02017nam0 2200349 i 450 VAN005500220240126100200.45608-218-0379-420061031d1995 |0itac50 baengUS|||| |||||Different aspects of coding theoryAmerican Mathematical Society short course January 2-3, 1995 San Francisco, CaliforniaRobert Calderbank editorProvidenceAmerican Mathematical Society1995VIII, 239 p.25 cm001VAN00272112001 Proceedings of symposia in applied mathematics210 ProvidenceAmerican mathematical society.5068-XXComputer science [MSC 2020]VANC019670MF94-XXInformation and communication theory, circuits [MSC 2020]VANC019701MF00B25Proceedings of conferences of miscellaneous specific interest [MSC 2020]VANC020732MF93-XXSystems theory; control [MSC 2020]VANC027040MFUSProvidenceVANL000273CalderbankRobertVANV04351361434American mathematical societyVANV108732650ITSOL20240202RICAhttp://books.google.it/books?id=TcOzdq3nDp4C&printsec=frontcover&hl=ithttp://books.google.it/books?id=TcOzdq3nDp4C&printsec=frontcover&hl=itSUN - BIBLIOTECA FACOLTÀ MEDICINA CASERTAVAN09VAN0055002BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08PREST 05-XX 0690 08 5048 I 20080115 SUN - BIBLIOTECA FACOLTÀ MEDICINA CASERTA09PREST 7A80 09 5048 20061031 BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08PREST SMARRITO 08 1198 20111125 DeterioratoDifferent aspects of coding theory923057UNICAMPANIA04202nam 2200961z- 450 991058593800332120220812(CKB)5600000000483102(oapen)https://directory.doabooks.org/handle/20.500.12854/91158(oapen)doab91158(oapen)91158(EXLCZ)99560000000048310220202208d2022 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierPhotonic Technology for Precision MetrologyBaselMDPI - Multidisciplinary Digital Publishing Institute20221 online resource (126 p.)3-0365-4493-3 3-0365-4494-1 Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon-matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared range. Since the invention of the laser, a source of highly coherent optical radiation, optical measurements have become the perfect tool for highly precise and accurate measurements. Such measurements have the additional advantages of requiring no contact and a fast rate suitable for in-process metrology. However, their extreme precision is ultimately limited by, e.g., the noise of both lasers and photodetectors. The Special Issue of the Applied Science is devoted to the cutting-edge uses of optical sources, detectors, and optoelectronics systems in numerous fields of science and technology (e.g., industry, environment, healthcare, telecommunication, security, and space). The aim is to provide detail on state-of-the-art photonic technology for precision metrology and identify future developmental directions. This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems.History of engineering & technologybicsscTechnology: general issuesbicsscHistory of engineering and technologybicssc2D material photodetectorsabsorption spectroscopyaccuracyammonia detectionBLIP conditionCEASchopper stabilised op-ampcolloidal quantum dot photodetectorsCRDSdeep learningdisplacement measuring interferometerelectro-optic modulatorfibreoptic couplingfluorescence microscopyfourier ptychographyfree space opticsfrequency modulationFTIRgas sensorsHgCdTeHOT IR detectorshybrid photodetector (HPD)image classificationindium arsenide antimony photodiodeinfrared modulatorinfrared thermometerlaser absorption spectroscopylaser controllerlaser spectroscopylow-light photodetectorsmid-wave infraredMOX sensorsMUPASSneural networkNH3optoelectronic sensorsP-i-NPASphotonic metrologypolymer sensorsprecisionquantum cascade laserresolutionsingle-molecule fluorescence detectiontime-resolved fluorescence microscopyuncooled thermometerzero-drift pre-amplifierHistory of engineering & technologyTechnology: general issuesHistory of engineering and technologyWojtas Jacekedt1314128Wojtas JacekothBOOK9910585938003321Photonic Technology for Precision Metrology3031739UNINA