LEADER 04057nam 2200925z- 450 001 9910585938003321 005 20220812 035 $a(CKB)5600000000483102 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/91158 035 $a(oapen)doab91158 035 $a(EXLCZ)995600000000483102 100 $a20202208d2022 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aPhotonic Technology for Precision Metrology 210 $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022 215 $a1 online resource (126 p.) 311 08$a3-0365-4493-3 311 08$a3-0365-4494-1 330 $aPhotonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon-matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared range. Since the invention of the laser, a source of highly coherent optical radiation, optical measurements have become the perfect tool for highly precise and accurate measurements. Such measurements have the additional advantages of requiring no contact and a fast rate suitable for in-process metrology. However, their extreme precision is ultimately limited by, e.g., the noise of both lasers and photodetectors. The Special Issue of the Applied Science is devoted to the cutting-edge uses of optical sources, detectors, and optoelectronics systems in numerous fields of science and technology (e.g., industry, environment, healthcare, telecommunication, security, and space). The aim is to provide detail on state-of-the-art photonic technology for precision metrology and identify future developmental directions. This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems. 606 $aHistory of engineering & technology$2bicssc 606 $aTechnology: general issues$2bicssc 610 $a2D material photodetectors 610 $aabsorption spectroscopy 610 $aaccuracy 610 $aammonia detection 610 $aBLIP condition 610 $aCEAS 610 $achopper stabilised op-amp 610 $acolloidal quantum dot photodetectors 610 $aCRDS 610 $adeep learning 610 $adisplacement measuring interferometer 610 $aelectro-optic modulator 610 $afibreoptic coupling 610 $afluorescence microscopy 610 $afourier ptychography 610 $afree space optics 610 $afrequency modulation 610 $aFTIR 610 $agas sensors 610 $aHgCdTe 610 $aHOT IR detectors 610 $ahybrid photodetector (HPD) 610 $aimage classification 610 $aindium arsenide antimony photodiode 610 $ainfrared modulator 610 $ainfrared thermometer 610 $alaser absorption spectroscopy 610 $alaser controller 610 $alaser spectroscopy 610 $alow-light photodetectors 610 $amid-wave infrared 610 $aMOX sensors 610 $aMUPASS 610 $aneural network 610 $aNH3 610 $aoptoelectronic sensors 610 $aP-i-N 610 $aPAS 610 $aphotonic metrology 610 $apolymer sensors 610 $aprecision 610 $aquantum cascade laser 610 $aresolution 610 $asingle-molecule fluorescence detection 610 $atime-resolved fluorescence microscopy 610 $auncooled thermometer 610 $azero-drift pre-amplifier 615 7$aHistory of engineering & technology 615 7$aTechnology: general issues 700 $aWojtas$b Jacek$4edt$01314128 702 $aWojtas$b Jacek$4oth 906 $aBOOK 912 $a9910585938003321 996 $aPhotonic Technology for Precision Metrology$93031739 997 $aUNINA