Microelectronics failure analysis [[electronic resource] ] : desk reference / / edited by Richard J. Ross
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| Titolo: |
Microelectronics failure analysis [[electronic resource] ] : desk reference / / edited by Richard J. Ross
|
| Pubblicazione: | Materials Park, Ohio, : ASM International, c2011 |
| Edizione: | 6th ed. |
| Descrizione fisica: | 1 online resource (672 p.) |
| Disciplina: | 621.381 |
| Soggetto topico: | Electronics - Materials - Testing |
| Microelectronics - Materials - Testing | |
| Microelectronics - Materials - Defects | |
| Electronic apparatus and appliances - Testing | |
| Semiconductors - Defects | |
| Altri autori: |
RossRichard J
|
| Note generali: | Description based upon print version of record. |
| Nota di bibliografia: | Includes bibliographical references and indexes. |
| Nota di contenuto: | section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information. |
| Titolo autorizzato: | Microelectronics failure analysis |
| ISBN: | 1-61503-726-8 |
| 1-61503-837-X | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9911006561003321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |