Absolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy / / Donald J. Roth [and four others]
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| Autore: |
Roth Donald J.
|
| Titolo: |
Absolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy / / Donald J. Roth [and four others]
|
| Pubblicazione: | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , December 2013 |
| Descrizione fisica: | 1 online resource (22 pages) : illustrations (some color) |
| Soggetto topico: | Electromagnetic measurement |
| Dielectrics | |
| Substrates | |
| Thermal control coatings | |
| Note generali: | Title from title screen (viewed Jan. 8, 2015). |
| "December 2013." | |
| Nota di bibliografia: | Includes bibliographical references (page 22). |
| Titolo autorizzato: | Absolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910702782403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |