01602nam 2200433I 450 991070278240332120150108140818.0(CKB)5470000002430372(OCoLC)899588586(EXLCZ)99547000000243037220150108j201312 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierAbsolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy /Donald J. Roth [and four others]Cleveland, Ohio :National Aeronautics and Space Administration, Glenn Research Center,December 2013.1 online resource (22 pages) illustrations (some color)NASA/TM ;2013-216603Title from title screen (viewed Jan. 8, 2015)."December 2013."Includes bibliographical references (page 22).Electromagnetic measurementnasatDielectricsnasatSubstratesnasatThermal control coatingsnasatElectromagnetic measurement.Dielectrics.Substrates.Thermal control coatings.Roth Donald J.1405440NASA Glenn Research Center,GPOGPOBOOK9910702782403321Absolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy3481941UNINA