LEADER 01127nam2-2200373---450- 001 990001708870203316 005 20090506113933.0 035 $a000170887 035 $aUSA01000170887 035 $a(ALEPH)000170887USA01 035 $a000170887 100 $a20040528d1949----km-y0itay50------ba 101 0 $afre 102 $aFR 105 $aa|||z|||001yy 200 1 $a<> Tunisie$fpar Jacques Klein 210 $aParis$cPresses universitaires de France$d1949 215 $a125 p.$cill., c. geogr.$d18 cm 225 2 $aQue sais-je?$v318 410 0$1001000311637$12001$aQue sais-je?$v, 318 607 $aTunisia$xStoria$2BNCF 676 $a961.1 700 1$aKLEIN,$bJacques$0129557 801 0$aIT$bsalbc$gISBD 912 $a990001708870203316 951 $aVI.4. Coll. 22/ 86(I B Coll. 27/1)$b687 L.M.$cVI.4. Coll.$d00166364 959 $aBK 969 $aUMA 979 $aSIAV1$b10$c20040528$lUSA01$h1200 979 $aCOPAT1$b90$c20050309$lUSA01$h0956 979 $aANNAMARIA$b90$c20080620$lUSA01$h0929 979 $aANNAMARIA$b90$c20090506$lUSA01$h1139 996 $aTunisie$9449590 997 $aUNISA LEADER 01602nam 2200433I 450 001 9910702782403321 005 20150108140818.0 035 $a(CKB)5470000002430372 035 $a(OCoLC)899588586 035 $a(EXLCZ)995470000002430372 100 $a20150108j201312 ua 0 101 0 $aeng 135 $aurmn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAbsolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy /$fDonald J. Roth [and four others] 210 1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dDecember 2013. 215 $a1 online resource (22 pages) $cillustrations (some color) 225 1 $aNASA/TM ;$v2013-216603 300 $aTitle from title screen (viewed Jan. 8, 2015). 300 $a"December 2013." 320 $aIncludes bibliographical references (page 22). 606 $aElectromagnetic measurement$2nasat 606 $aDielectrics$2nasat 606 $aSubstrates$2nasat 606 $aThermal control coatings$2nasat 615 7$aElectromagnetic measurement. 615 7$aDielectrics. 615 7$aSubstrates. 615 7$aThermal control coatings. 700 $aRoth$b Donald J.$01405440 712 02$aNASA Glenn Research Center, 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910702782403321 996 $aAbsolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy$93481941 997 $aUNINA