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An engineer's guide to automated testing of high-speed interfaces / / Jose Moreira, Hubert Werkmann



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Autore: Moreira Jose <1975-> Visualizza persona
Titolo: An engineer's guide to automated testing of high-speed interfaces / / Jose Moreira, Hubert Werkmann Visualizza cluster
Pubblicazione: Boston, : Artech House, c2010
Edizione: 1st ed.
Descrizione fisica: 1 online resource (590 p.)
Disciplina: 621.381548
Soggetto topico: Very high speed integrated circuits
Automatic test equipment
Altri autori: WerkmannHubert  
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC
E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index
Sommario/riassunto: Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.
Titolo autorizzato: Engineer’s guide to automated testing of high-speed interfaces  Visualizza cluster
ISBN: 9781607839842
1607839849
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910953325703321
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Serie: Artech House microwave library.