LEADER 03409nam 2200649Ia 450 001 9910953325703321 005 20241120174816.0 010 $a9781607839842 010 $a1607839849 035 $a(CKB)2670000000047203 035 $a(EBL)587849 035 $a(OCoLC)670411566 035 $a(SSID)ssj0000416891 035 $a(PQKBManifestationID)12139589 035 $a(PQKBTitleCode)TC0000416891 035 $a(PQKBWorkID)10436916 035 $a(PQKB)11223683 035 $a(Au-PeEL)EBL587849 035 $a(CaPaEBR)ebr10421850 035 $a(CaBNVSL)mat09106079 035 $a(IEEE)9106079 035 $a(MiAaPQ)EBC587849 035 $a(Perlego)4667744 035 $a(EXLCZ)992670000000047203 100 $a20100903d2010 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 13$aAn engineer's guide to automated testing of high-speed interfaces /$fJose Moreira, Hubert Werkmann 205 $a1st ed. 210 $aBoston $cArtech House$dc2010 215 $a1 online resource (590 p.) 225 1 $aArtech House microwave library 300 $aDescription based upon print version of record. 311 08$a9781607839835 311 08$a1607839830 320 $aIncludes bibliographical references and index. 327 $aAn Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC 327 $aE Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index 330 3 $aProviding a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.$cPublisher abstract. 410 0$aArtech House microwave library. 606 $aVery high speed integrated circuits 606 $aAutomatic test equipment 615 0$aVery high speed integrated circuits. 615 0$aAutomatic test equipment. 676 $a621.381548 700 $aMoreira$b Jose$f1975-$0771266 701 $aWerkmann$b Hubert$0771267 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910953325703321 996 $aEngineer?s guide to automated testing of high-speed interfaces$91573799 997 $aUNINA