01127nam--2200385---450 99000315338020331620170711131050.088-87017-50-6000315338USA01000315338(ALEPH)000315338USA0100031533820080930d2006----km-y0itay50------baitaIT||||||||001yyManuale di progettazionebibliotecheLuciano De Licio[Roma]Mancosu20061 v. (paginazione varia)ill.30 cmTecno TipoSezione Tipologie12001Tecno TipoSezione Tipologie2001001-------2001BibliotecheArchitettura727.8DE LICIO,Luciano274397ITsalbcISBD990003153380203316727.8 DEL20948 Tec.727.800167701727.824 DEL 123358 Ing.72700332061BKTECFIORELLA9020080930USA011402Manuale di progettazione1018102UNISA00970nam0 22002531i 450 UON0031560720231205104116.25820080923d1963 |0itac50 baporPT|||| 1||||De Florença a Nova IorqueUrbano Tavares RodriguesLisboaPortugalia Editoria[1963]286 p.17 cm.001UON003083492001 ˆO‰Livro de bolso210 LisboaPortugalia46-47PTLisboaUONL003135RODRIGUESUrbano TavaresUONV131109542892PortugáliaUONV268348650ITSOL20240220RICASIBA - SISTEMA BIBLIOTECARIO DI ATENEOUONSIUON00315607SIBA - SISTEMA BIBLIOTECARIO DI ATENEOSI Port IX 077 SI SP 114 5 077 De Florença a Nova Iorque1373611UNIOR03409nam 2200649Ia 450 991095332570332120241120174816.097816078398421607839849(CKB)2670000000047203(EBL)587849(OCoLC)670411566(SSID)ssj0000416891(PQKBManifestationID)12139589(PQKBTitleCode)TC0000416891(PQKBWorkID)10436916(PQKB)11223683(Au-PeEL)EBL587849(CaPaEBR)ebr10421850(CaBNVSL)mat09106079(IEEE)9106079(MiAaPQ)EBC587849(Perlego)4667744(EXLCZ)99267000000004720320100903d2010 uy 0engur|n|---|||||txtccrAn engineer's guide to automated testing of high-speed interfaces /Jose Moreira, Hubert Werkmann1st ed.Boston Artech Housec20101 online resource (590 p.)Artech House microwave libraryDescription based upon print version of record.9781607839835 1607839830 Includes bibliographical references and index.An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRCE Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; IndexProviding a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.Publisher abstract.Artech House microwave library.Very high speed integrated circuitsAutomatic test equipmentVery high speed integrated circuits.Automatic test equipment.621.381548Moreira Jose1975-771266Werkmann Hubert771267MiAaPQMiAaPQMiAaPQBOOK9910953325703321Engineer’s guide to automated testing of high-speed interfaces1573799UNINA