Full field birefringence measurement of grown-in stresses in thin silicon sheet [[electronic resource] ] : final technical report 2 January 2002 - 15 January 2008 / / S. Danyluk, S. Ostapenko
(Visualizza in formato marc)
(Visualizza in BIBFRAME)
| Autore: |
Danyluk Steven S
|
| Titolo: |
Full field birefringence measurement of grown-in stresses in thin silicon sheet [[electronic resource] ] : final technical report 2 January 2002 - 15 January 2008 / / S. Danyluk, S. Ostapenko
|
| Pubblicazione: | Golden, Colo. : , : National Renewable Energy Laboratory, , [2008] |
| Descrizione fisica: | 23 pages : digital, PDF file |
| Soggetto topico: | Photovoltaic cells - Research |
| Solar cells - Design and construction | |
| Altri autori: |
OstapenkoS
|
| Note generali: | Title from title screen (viewed on Mar. 19, 2009). |
| "November 2008." | |
| Altri titoli varianti: | Full Field Birefringence Measurement of Grown-In Stresses in Thin Silicon Sheet |
| Titolo autorizzato: | Full field birefringence measurement of grown-in stresses in thin silicon sheet |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910693481403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |