LEADER 01534nam  2200397Ia 450 
001 9910693481403321
005 20090319154054.0
035   $a(CKB)4330000001847207
035   $a(OCoLC)316339870
035   $a(EXLCZ)994330000001847207
100   $a20090319d2008      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aFull field birefringence measurement of grown-in stresses in thin silicon sheet$b[electronic resource] $efinal technical report 2 January 2002 - 15 January 2008 /$fS. Danyluk, S. Ostapenko
210  1$aGolden, Colo. :$cNational Renewable Energy Laboratory,$d[2008]
215   $a23 pages $cdigital, PDF file
225 1 $aSubcontract report ;$vNREL/SR-520-44237
300   $aTitle from title screen (viewed on Mar. 19, 2009).
300   $a"November 2008."
517   $aFull Field Birefringence Measurement of Grown-In Stresses in Thin Silicon Sheet 
606   $aPhotovoltaic cells$xResearch
606   $aSolar cells$xDesign and construction
615  0$aPhotovoltaic cells$xResearch.
615  0$aSolar cells$xDesign and construction.
700   $aDanyluk$b Steven S$01422713
701   $aOstapenko$b S$01422714
712 02$aNational Renewable Energy Laboratory (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910693481403321
996   $aFull field birefringence measurement of grown-in stresses in thin silicon sheet$93547867
997   $aUNINA