01534nam 2200397Ia 450 991069348140332120090319154054.0(CKB)4330000001847207(OCoLC)316339870(EXLCZ)99433000000184720720090319d2008 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierFull field birefringence measurement of grown-in stresses in thin silicon sheet[electronic resource] final technical report 2 January 2002 - 15 January 2008 /S. Danyluk, S. OstapenkoGolden, Colo. :National Renewable Energy Laboratory,[2008]23 pages digital, PDF fileSubcontract report ;NREL/SR-520-44237Title from title screen (viewed on Mar. 19, 2009)."November 2008."Full Field Birefringence Measurement of Grown-In Stresses in Thin Silicon Sheet Photovoltaic cellsResearchSolar cellsDesign and constructionPhotovoltaic cellsResearch.Solar cellsDesign and construction.Danyluk Steven S1422713Ostapenko S1422714National Renewable Energy Laboratory (U.S.)GPOGPOBOOK9910693481403321Full field birefringence measurement of grown-in stresses in thin silicon sheet3547867UNINA