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Autore: | Celano Umberto |
Titolo: | Metrology and Physical Mechanisms in New Generation Ionic Devices / / by Umberto Celano |
Pubblicazione: | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
Edizione: | 1st ed. 2016. |
Descrizione fisica: | 1 online resource (XXIV, 175 p. 96 illus., 18 illus. in color.) |
Disciplina: | 621.38152 |
Soggetto topico: | Spectroscopy |
Microscopy | |
Nanotechnology | |
Materials science | |
Spectroscopy and Microscopy | |
Nanotechnology and Microengineering | |
Characterization and Evaluation of Materials | |
Nota di bibliografia: | Includes bibliographical references. |
Nota di contenuto: | Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. . |
Sommario/riassunto: | The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. . |
Titolo autorizzato: | Metrology and Physical Mechanisms in New Generation Ionic Devices |
ISBN: | 3-319-39531-9 |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910254620403321 |
Lo trovi qui: | Univ. Federico II |
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