Three-dimensional computed tomography as a method for finding die attach voids in diodes [[electronic resource] /] / E.N. Brahm, T.D. Rolin
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| Autore: |
Brahm E. N
|
| Titolo: |
Three-dimensional computed tomography as a method for finding die attach voids in diodes [[electronic resource] /] / E.N. Brahm, T.D. Rolin
|
| Pubblicazione: | [Huntsville], Ala. : , : National Aeronautics and Space Administration, Marshall Space Flight Center, , [2010] |
| Descrizione fisica: | 1 online resource (ix, 21 pages) : illustrations (some color) |
| Soggetto topico: | Electromechanics |
| Failure modes | |
| Diodes | |
| Detection | |
| Failure | |
| Metallography | |
| NASA programs | |
| Radiography | |
| Altri autori: |
RolinTerry
|
| Note generali: | Title from title screen (viewed on Aug. 25, 2011). |
| "September 2010." | |
| Nota di bibliografia: | Includes bibliographical references (page 21). |
| Altri titoli varianti: | Three dimensional computed tomography as a method for finding die attach voids in diodes |
| Titolo autorizzato: | Three-dimensional computed tomography as a method for finding die attach voids in diodes |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910699921303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |