LEADER 01928nam  2200553Ia 450 
001 9910699921303321
005 20110825092118.0
035   $a(CKB)5470000002406747
035   $a(OCoLC)747818998
035   $a(EXLCZ)995470000002406747
100   $a20110825d2010      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aThree-dimensional computed tomography as a method for finding die attach voids in diodes$b[electronic resource] /$fE.N. Brahm, T.D. Rolin
210  1$a[Huntsville], Ala. :$cNational Aeronautics and Space Administration, Marshall Space Flight Center,$d[2010]
215   $a1 online resource (ix, 21 pages) $cillustrations (some color)
225 1 $aNASA/TM ;$v2010-216442
300   $aTitle from title screen (viewed on Aug. 25, 2011).
300   $a"September 2010."
320   $aIncludes bibliographical references (page 21).
517 3 $aThree dimensional computed tomography as a method for finding die attach voids in diodes
606   $aElectromechanics$2nasat
606   $aFailure modes$2nasat
606   $aDiodes$2nasat
606   $aDetection$2nasat
606   $aFailure$2nasat
606   $aMetallography$2nasat
606   $aNASA programs$2nasat
606   $aRadiography$2nasat
615  7$aElectromechanics.
615  7$aFailure modes.
615  7$aDiodes.
615  7$aDetection.
615  7$aFailure.
615  7$aMetallography.
615  7$aNASA programs.
615  7$aRadiography.
700   $aBrahm$b E. N$01395907
701   $aRolin$b Terry$01395908
712 02$aGeorge C. Marshall Space Flight Center.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910699921303321
996   $aThree-dimensional computed tomography as a method for finding die attach voids in diodes$93455154
997   $aUNINA