01928nam 2200553Ia 450 991069992130332120110825092118.0(CKB)5470000002406747(OCoLC)747818998(EXLCZ)99547000000240674720110825d2010 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierThree-dimensional computed tomography as a method for finding die attach voids in diodes[electronic resource] /E.N. Brahm, T.D. Rolin[Huntsville], Ala. :National Aeronautics and Space Administration, Marshall Space Flight Center,[2010]1 online resource (ix, 21 pages) illustrations (some color)NASA/TM ;2010-216442Title from title screen (viewed on Aug. 25, 2011)."September 2010."Includes bibliographical references (page 21).Three dimensional computed tomography as a method for finding die attach voids in diodesElectromechanicsnasatFailure modesnasatDiodesnasatDetectionnasatFailurenasatMetallographynasatNASA programsnasatRadiographynasatElectromechanics.Failure modes.Diodes.Detection.Failure.Metallography.NASA programs.Radiography.Brahm E. N1395907Rolin Terry1395908George C. Marshall Space Flight Center.GPOGPOBOOK9910699921303321Three-dimensional computed tomography as a method for finding die attach voids in diodes3455154UNINA