Autore	Van der Heide Paul <1962->
Pubbl/distr/stampa	Hoboken, N.J., : Wiley, c2012
Descrizione fisica	1 online resource (262 p.)
Disciplina	543/.62
Soggetto topico	X-ray photoelectron spectroscopy Spectrum analysis
ISBN	1-283-33247-7 9786613332479 1-118-16290-0 1-118-16289-7 1-118-16292-7
Classificazione	SCI078000
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Nota di contenuto	X-RAY PHOTOELECTRON SPECTROSCOPY: An Introduction to Principles and Practices; CONTENTS; FOREWORD; PREFACE; ACKNOWLEDGMENTS; LIST OF CONSTANTS; CHAPTER 1: INTRODUCTION; 1.1 SURFACE ANALYSIS; 1.2 XPS/ESCA FOR SURFACE ANALYSIS; 1.3 HISTORICAL PERSPECTIVE; 1.4 PHYSICAL BASIS OF XPS; 1.5 SENSITIVITY AND SPECIFICITY OF XPS; 1.6 SUMMARY; CHAPTER 2: ATOMS, IONS, AND THEIR ELECTRONIC STRUCTURE; 2.1 ATOMS, IONS, AND MATTER; 2.1.1 Atomic Structure; 2.1.2 Electronic Structure; 2.1.2.1 Quantum Numbers; 2.1.2.2 Stationary-State Notation; 2.1.2.3 Stationary-State Transition Notation 2.1.2.4 Stationary States 2.1.2.5 Spin Orbit Splitting; 2.2 SUMMARY; CHAPTER 3: XPS INSTRUMENTATION; 3.1 PREREQUISITES OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS); 3.1.1 Vacuum; 3.1.1.1 Vacuum Systems; 3.1.2 X-ray Sources; 3.1.2.1 Standard Sources; 3.1.2.2 Monochromated Sources; 3.1.2.3 Gas Discharge Lamps; 3.1.2.4 Synchrotron Sources; 3.1.3 Electron Sources; 3.1.3.1 Thermionic Sources; 3.1.4 Ion Sources; 3.1.4.1 EI Sources; 3.1.5 Energy Analyzers; 3.1.5.1 CMA; 3.1.5.2 CHA; 3.1.5.3 Modes of Operation; 3.1.5.4 Energy Resolution; 3.1.6 Detectors; 3.1.6.1 EMs; 3.1.7 Imaging; 3.1.7.1 Serial Imaging 3.1.7.2 Parallel Imaging 3.1.7.3 Spatial Resolution; 3.2 SUMMARY; CHAPTER 4: DATA COLLECTION AND QUANTIFICATION; 4.1 ANALYSIS PROCEDURES; 4.1.1 Sample Handling; 4.1.2 Data Collection; 4.1.3 Energy Referencing; 4.1.4 Charge Compensation; 4.1.5 X-ray and Electron-Induced Damage; 4.2 PHOTOELECTRON INTENSITIES; 4.2.1 Photoelectron Cross Sections; 4.2.2 The Analyzed Volume; 4.2.2.1 Electron Path Lengths; 4.2.2.2 Takeoff Angle; 4.2.3 The Background Signal; 4.2.4 Quantification; 4.3 INFORMATION AS A FUNCTION OF DEPTH; 4.3.1 Opening up the Third Dimension; 4.3.1.1 AR-XPS and Energy-Resolved XPS 4.3.1.2 Sputter Depth Profiling 4.4 SUMMARY; CHAPTER 5: SPECTRAL INTERPRETATION; 5.1 SPECIATION; 5.1.1 Photoelectron Binding Energies; 5.1.1.1 The Z + 1 Approximation; 5.1.1.2 Initial State Effects; 5.1.1.3 Final State Effects; 5.1.1.4 The Auger Parameter; 5.1.1.5 Curve Fitting; 5.2 SUMMARY; CHAPTER 6: SOME CASE STUDIES; 6.1 OVERVIEW; 6.1.1 Iodine Impregnation of Single-Walled Carbon Nanotube (SWNT); 6.1.2 Analysis of Group IIA-IV Metal Oxides; 6.1.3 Analysis of Mixed Metal Oxides of Interest as SOFC Cathodes; 6.1.4 Analysis of YBCO and Related Oxides/Carbonates; 6.2 SUMMARY; APPENDICES APPENDIX A: PERIODIC TABLE OF THE ELEMENTS APPENDIX B: BINDING ENERGIES (B.E.XPS ORB.E.XRF) OF THE ELEMENTS; B.1 1S-3S, 2P-3P, AND 3D VALUES; B.2 4S-5S, 4P-5P, AND 4D VALUES; APPENDIX C: SOME QUANTUM MECHANICS CALCULATIONS OF INTEREST; APPENDIX D: SOME STATISTICAL DISTRIBUTIONS OF INTEREST; D.1 GAUSSIAN DISTRIBUTION; D.2 POISSON DISTRIBUTION; D.3 LORENTZIAN DISTRIBUTIONS; APPENDIX E: SOME OPTICAL PROPERTIES OF INTEREST; E.1 CHROMATIC ABERRATIONS; E.2 SPHERICAL ABERRATIONS; E.3 DIFFRACTION LIMIT; APPENDIX F: SOME OTHER SPECTROSCOPIC/SPECTROMETRIC TECHNIQUES OF INTEREST F.1 PHOTON SPECTROSCOPIES
Record Nr.	UNINA-9910139552903321

Pubbl/distr/stampa	Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004
Descrizione fisica	1 online resource (617 p.)
Disciplina	543.08586 543.62 543/.62
Altri autori (Persone)	TsujiKouichi InjukJasna GriekenR. van (René)
Soggetto topico	X-ray spectroscopy
Soggetto genere / forma	Electronic books.
ISBN	1-280-23888-7 9786610238880 0-470-02042-3 0-470-02043-1
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Nota di contenuto	X-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry Index
Record Nr.	UNINA-9910146051803321

Autore	Stout, George H.
Edizione	[2. ed.]
Pubbl/distr/stampa	New York : Wiley, 1989
Descrizione fisica	XV, 453 p. : ill. ; 23 cm
Altri autori (Persone)	Jensen, Lyle H.
ISBN	0471607118
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Record Nr.	UNINA-990009763350403321

Autore	Wentk Richard
Edizione	[1st edition]
Pubbl/distr/stampa	Indianapolis, Indiana : , : Wiley, , 2014
Descrizione fisica	1 online resource (578 p.)
Disciplina	005.1
Collana	Developer Reference
Soggetto topico	Application software - Development Computer software - Development Operating systems (Computers)
Soggetto genere / forma	Electronic books.
ISBN	1-118-83513-1 1-118-83439-9
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Nota di contenuto	About the Author; Contents; Preface; Acknowledgments; Introduction; Part I: Getting Started with Xcode 5; Chapter 1: Introducing Xcode 5; Understanding the History of Mac Development Tools; Understanding Xcode 5's Key Features; Moving to Xcode 5; Comparing iOS and OS X Development; Summary; Chapter 2: Getting and Installing Xcode; Selecting a Mac for Xcode; Getting Started with Development; Getting Started with Xcode; Summary; Chapter 3: Building Applications from Templates; Getting Started with Templates; Customizing Projects and Templates; Summary; Chapter 4: Navigating the Xcode Interface Understanding the InterfaceUsing the Navigation Area; Using the Utility Area; Working with the Editor Area; Summary; Chapter 5: Working with Files, Frameworks, and Classes; Working with Files and Classes; Working with Groups; Working with Frameworks; Summary; Chapter 6: Using Documentation; Understanding the Apple Documentation; Using the Xcode Documentation Viewer; Using Other Documentation; Summary; Chapter 7: Getting Started with Interface Builder; Understanding IB; Getting Started with IB; Creating a Simple iOS Project with IB; Understanding the IB Object Hierarchy; Designing without IB SummaryChapter 8: Creating More Advanced Effects with Interface Builder; Working with Constraints; Getting Started with Storyboards; Understanding Placeholders; Subclassing and Customizing Views; Supporting Non-English Languages; Working with Advanced IB Techniques; Summary; Part II: Going Deeper; Chapter 9: Saving Time in Xcode; Using Code Folding; Editing Structure; Refactoring Code; Using Code Snippets; Jumping to a Definition; Revealing Symbols; Summary; Chapter 10: Using the Organizer; Working with the Library; Working with Projects and Archives; Summary Chapter 11: Managing Certificates, Identifiers, and Provisioning ProfilesUnderstanding Provisioning; Getting Started with Provisioning; Creating Certificates and Identities; Summary; Chapter 12: Working with Builds, Schemes, and Workspaces; Getting Started with the Xcode Build System; Working with Schemes and Build Configurations; Summary; Chapter 13: Customizing Builds for Development and Distribution; Introducing Common Basic Customizations; Creating an App Store Submission; Working with iOS Ad Hoc builds; Creating Mac Developer ID Builds; Summary Chapter 14: Advanced Workspace and Build ManagementUnderstanding the Build Process; Creating Custom Builds; Working with Build Phases; Working with Libraries and Headers; Summary; Chapter 15: Using Version Control; Using Manual Version Control; Using Snapshots; Working with Git Source Control; Using Xcode with GitHub; Summary; Part III: Creating Fast and Reliable Code; Chapter 16: Getting Started with Code Analysis and Debugging; Checking and Analyzing Code; Getting Started with Debugging; Using the Console; Working with Breakpoints; Advanced Debugging; Summary Chapter 17: Testing Code with Instruments
Record Nr.	UNINA-9910465027703321