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Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium



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Titolo: Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium Visualizza cluster
Pubblicazione: New York, NY : , : Institute of Electrical and Electronics Engineers, , 1991-
Disciplina: 621
621.3815/2
Soggetto topico: Semiconductors - Thermal properties
Semiconductors - Cooling
Amorphous semiconductors - Thermal properties
Integrated circuits
Soggetto genere / forma: Conference papers and proceedings.
Titolo autorizzato: Proceedings  Visualizza cluster
Formato: Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione: Inglese
Record Nr.: 996279663203316
Lo trovi qui: Univ. di Salerno
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Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium
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Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium
IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council