01881nas 22005053 450 99627966320331620211006213032.0(OCoLC)556575073(CKB)110978984565257(CONSER)--2018200150(EXLCZ)9911097898456525720100315a19919999 --- aengurbn||||||abpurbn||||||adatxtrdacontentcrdamediacrrdacarrierProceedings /Annual IEEE Semiconductor Thermal Measurement and Management SymposiumNew York, NY :Institute of Electrical and Electronics Engineers,1991-1065-2221 SemiconductorsThermal propertiesCongressesSemiconductorsCoolingCongressesAmorphous semiconductorsThermal propertiesCongressesIntegrated circuitsCongressesAmorphous semiconductorsThermal propertiesfast(OCoLC)fst00807853Integrated circuitsfast(OCoLC)fst00975535SemiconductorsCoolingfast(OCoLC)fst01112209SemiconductorsThermal propertiesfast(OCoLC)fst01112264Conference papers and proceedings.fastSemiconductorsThermal propertiesSemiconductorsCoolingAmorphous semiconductorsThermal propertiesIntegrated circuitsAmorphous semiconductorsThermal properties.Integrated circuits.SemiconductorsCooling.SemiconductorsThermal properties.621621.3815/2IEEE Components, Hybrids, and Manufacturing Technology Society.CONFERENCE996279663203316Proceedings57126UNISA