Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials [[electronic resource] /] / by Wendy L. Sarney
(Visualizza in formato marc)
(Visualizza in BIBFRAME)
| Autore: |
Sarney Wendy L
|
| Titolo: |
Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials [[electronic resource] /] / by Wendy L. Sarney
|
| Pubblicazione: | Adelphi, MD : , : Army Research Laboratory, , [2003] |
| Descrizione fisica: | 1 online resource (iv, 17 pages) : color illustrations |
| Soggetto topico: | Diffraction patterns - Analysis |
| Semiconductors - Materials - Structure - Analysis | |
| Transmission electron microscopes | |
| Note generali: | Title from title screen (viewed on Dec. 1, 2010). |
| "December 2003." | |
| Nota di bibliografia: | Includes bibliographical references. |
| Titolo autorizzato: | Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910699582803321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
ARL-TR (Aberdeen Proving Ground, Md.) ; ; 3128.