01616nam 2200421Ia 450 991069958280332120230902161641.0(CKB)5470000002403095(OCoLC)688596560(EXLCZ)99547000000240309520101202d2003 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierUnderstanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials[electronic resource] /by Wendy L. SarneyAdelphi, MD :Army Research Laboratory,[2003]1 online resource (iv, 17 pages) color illustrationsARL-TR ;3128Title from title screen (viewed on Dec. 1, 2010)."December 2003."Includes bibliographical references.ARL-TR (Aberdeen Proving Ground, Md.) ;3128.Diffraction patternsAnalysisSemiconductorsMaterialsStructureAnalysisTransmission electron microscopesDiffraction patternsAnalysis.SemiconductorsMaterialsStructureAnalysis.Transmission electron microscopes.Sarney Wendy L1385934U.S. Army Research Laboratory.GPOGPOBOOK9910699582803321Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials3445708UNINA