Circadian Rhythms for Future Resilient Electronic Systems : Accelerated Active Self-Healing for Integrated Circuits / / by Xinfei Guo, Mircea R. Stan
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| Autore: |
Guo Xinfei
|
| Titolo: |
Circadian Rhythms for Future Resilient Electronic Systems : Accelerated Active Self-Healing for Integrated Circuits / / by Xinfei Guo, Mircea R. Stan
|
| Pubblicazione: | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Edizione: | 1st ed. 2020. |
| Descrizione fisica: | 1 online resource (215 pages) : illustrations |
| Disciplina: | 621.38173 |
| 621.3815 | |
| Soggetto topico: | Electronic circuits |
| Microprocessors | |
| Circuits and Systems | |
| Electronic Circuits and Devices | |
| Processor Architectures | |
| Persona (resp. second.): | StanMircea R |
| Nota di contenuto: | Introduction to Wearout -- Accelerated Self-Healing Techniques for BTI Wearout -- Accelerating and Activating Recovery for EM Wearout -- Circuit Techniques for Accelerated and Active Recovery -- Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience -- Design and Aging Challenges in FinFET Circuits and Internet of Things (IoT) Applications -- Future Directions in Self-Healing. |
| Sommario/riassunto: | This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT. |
| Titolo autorizzato: | Circadian Rhythms for Future Resilient Electronic Systems |
| ISBN: | 3-030-20051-5 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910366585403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |