LEADER 01099cam0-22003611i-450- 001 990005918670403321 005 20071030163048.0 035 $a000591867 035 $aFED01000591867 035 $a(Aleph)000591867FED01 035 $a000591867 100 $a20000112d1953----km-y0itay50------ba 101 1 $aita$cger 102 $aIT 105 $ay-------001yy 200 1 $aCriminologia$e3. edizione migliorata ed ampliata della "Biologia criminale"$fFranz Exner$gtradotta da Vittorio Kalmar-Fischer$gcon prefazione di Filippo Grispigni 210 $aMilano$cVallardi$d1953 215 $a344 p.$d24 cm 454 0$12001$aKriminologie$922810 676 $a360$v20$zIT 700 1$aExner,$bFranz$0379614 702 1$aGrispigni,$bFilippo 702 1$aKalmar-Fischer,$bVittorio 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990005918670403321 952 $aXII F 472$b74524$fFGBC 952 $aXII F 473$b74525$fFGBC 952 $aXII F 513$b91877$fFGBC 952 $aXII F 647$b16880*$fFGBC 959 $aFGBC 996 $aKriminologie$922810 997 $aUNINA LEADER 03370nam 22005055 450 001 9910366585403321 005 20200705233128.0 010 $a3-030-20051-5 024 7 $a10.1007/978-3-030-20051-0 035 $a(CKB)4100000008424376 035 $a(MiAaPQ)EBC5788940 035 $a(DE-He213)978-3-030-20051-0 035 $a(PPN)25887581X 035 $a(EXLCZ)994100000008424376 100 $a20190612d2020 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aCircadian Rhythms for Future Resilient Electronic Systems $eAccelerated Active Self-Healing for Integrated Circuits /$fby Xinfei Guo, Mircea R. Stan 205 $a1st ed. 2020. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2020. 215 $a1 online resource (215 pages) $cillustrations 311 $a3-030-20050-7 327 $aIntroduction to Wearout -- Accelerated Self-Healing Techniques for BTI Wearout -- Accelerating and Activating Recovery for EM Wearout -- Circuit Techniques for Accelerated and Active Recovery -- Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience -- Design and Aging Challenges in FinFET Circuits and Internet of Things (IoT) Applications -- Future Directions in Self-Healing. 330 $aThis book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT. 606 $aElectronic circuits 606 $aMicroprocessors 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010 606 $aProcessor Architectures$3https://scigraph.springernature.com/ontologies/product-market-codes/I13014 615 0$aElectronic circuits. 615 0$aMicroprocessors. 615 14$aCircuits and Systems. 615 24$aElectronic Circuits and Devices. 615 24$aProcessor Architectures. 676 $a621.38173 676 $a621.3815 700 $aGuo$b Xinfei$4aut$4http://id.loc.gov/vocabulary/relators/aut$0976173 702 $aStan$b Mircea R$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910366585403321 996 $aCircadian Rhythms for Future Resilient Electronic Systems$92223318 997 $aUNINA