Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007

• Pubblicazione: De Gruyter, 2008; Berlin ; ; Boston : , : Oldenbourg Wissenschaftsverlag, , [2015]; ©2008
• Descrizione fisica: 1 online resource (xii, 305 pages) : illustrations
• Soggetto topico: Cosmic physics; Geophysics
• Persona (resp. second.): BaczmańskiA; FaisA; MahajanA; TiduA; LarsonB. C.; Red'kinB. N.; HelmC. A.; GenzelCh; WüstefeldCh; HeD.; HegerD; KaurD; PathakD; RafajaD; Deepak; KudrenkoE. A.; PonyatovskyE. G.; MittemeijerE. J.; BorcaE; CotoiE; FilatovE; KrokeE; StrukovaG. K.; SchreiberG; CurtiusH; HolzschuhH; PesentiH; WulffH; ShmytkoI. M.; Shmyt'koI. M.; TomovI; ZizakI; RobinsonIan K.; FrancisJ. A.; WangJ. Y.; TischlerJ. Z.; BergmannJ; DrahokoupilJ; MusilJ; ČížekJ; ŠíchaJ; SaanouniK; UferK; WierzbanowskiK; LevineL. E.; NichtováL; KassnerM. E.; StoudtM. R.; BercuM; BirkholzM; DopitaM; FrançoisM; GriffithsM; JanečekM; KlausM; LeoniM; MotylenkoM; QuaasM; RůžičkaM; SchwarzM; SharafutdinovM; StranyánekM; TurskiM; WohlschlögelM; ČerčanskýM; ČerňanskýM; Mittemeijer; KlassenN. V.; DarowskiN; GanevN; HfaiedhN; KaurN; IvanovaO; ThomasO; WithersP. J.; BoháčP; GeantilP; LipinskiP; ScardiP; BediR. K.; DohrmannR; KleebergR; KuželR; ČtvrtlíkR; BrarS. S.; CherepanovaS. V.; TsybulyaS. V.; GeorgescuS.; HodorogeaS.; KumarS.; VassilevS.; BarsukovaT; WelzelU; ZlokazovV. B.; KedrovV. V.; SinitsynV. V.; CherkaskaV; KlemmV; LiuW; KuruY; ShubinYu; MatějZ
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Nota di bibliografia: Includes bibliographical references.
• Nota di contenuto: Frontmatter -- PREFACE -- Table of Contents -- PLANAR FAULTING -- Diffraction analysis of layer disorder / Leoni, M. -- Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering / Cherepanova, S. V. / Tsybulya, S. V. -- NANOCRYSTALLINE MATERIALS -- Interference phenomena in nanocrystalline materials and their application in the microstructure analysis / Rafaja, D. / Klemm, V. / Wüstefeld, Ch. / Motylenko, M. / Dopita, M. / Schwarz, M. / Barsukova, T. / Kroke, E. -- Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources / Robinson, Ian K. -- Capacitor discharge sintering of nanocrystalline copper / Fais, A. / Scardi, P. -- Microstructure study on BN nanocomposites using XRD and HRTEM / Motylenko, M. / Klemm, V. / Schreiber, G. / Rafaja, D. / Schwarz, M. / Barsukova, T. / Kroke, E. -- PLASTIC DEFORMATION -- Impact of dislocation cell elastic strain variations on line profiles from deformed copper / Levine, L. E. / Larson, B. C. / Tischler, J. Z. / Geantil, P. / Kassner, M. E. / Liu, W. / Stoudt, M. R. -- Determination of stored elastic energy in plastically deformed copper / Baczmański, A. / Hfaiedh, N. / François, M. / Saanouni, K. / Wierzbanowski, K. -- Structural studies of submicrocrystalline copper and copper composites by different methods / Kužel, R. / Cherkaska, V. / Matěj, Z. / Janeček, M. / Čížek, J. / Dopita, M. -- Grain stresses and elastic energy in ferritic steel under uniaxial load / Baczmański, A. / Tidu, A. / Lipinski, P. / Wierzbanowski, K. -- Stress and hardness in surface layers of shot-peened steels / Drahokoupil, J. / Ganev, N. / Čerňanský, M. / Boháč, P. / Čtvrtlík, R. / Stranyánek, M. -- LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN -- The "state of the art" of the diffraction analysis of crystallite size and lattice strain / Mittemeijer, E. J. / Welzel, U. -- Recent advancements in Whole Powder Pattern Modelling / Scardi, P. -- On the simulation of the anisotropic peak broadening in powder diffraction / Zlokazov, V. B. -- XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process / Borca, E. / Bercu, M. / Georgescu, S. / Hodorogea, S. / Cotoi, E. -- Cumulants and moments in the line profile analysis / Čerčanský, M. -- X-ray line-broadening analysis of dislocations in a single crystal of Zr / Griffiths, M. -- XRD line profile analysis of calcite powders produced by high energy milling / Pesenti, H. / Leoni, M. / Scardi, P. -- Refining real structure parameters of disordered layer structures within the Rietveld method / Ufer, K. / Kleeberg, R. / Bergmann, J. / Curtius, H. / Dohrmann, R. -- Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation / Wüstefeld, Ch. / Dopita, M. / Klemm, V. / Heger, D. / Rafaja, D. -- MATERIALS MICROSTRUCTURE -- Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films / Bedi, R. K. / Brar, S. S. / Kaur, N. / Kumar, S. / Mahajan, A. -- Structural and optical properties of AgInSe2 films / Bedi, R. K. / Pathak, D. / Deepak / Kaur, D. -- In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor / Filatov, E. / Shubin, Yu. / Sharafutdinov, M. -- Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium / He, D. / Wang, J. Y. / Mittemeijer -- Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments / Kudrenko, E. A. / Shmyt'ko, I. M. / Sinitsyn, V. V. / Ponyatovsky, E. G. / Red'kin, B. N. -- Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods / Shmytko, I. M. / Kudrenko, E. A. / Strukova, G. K. / Kedrov, V. V. / Klassen, N. V. -- Refinement of extinction-affected X-ray reflection profile of textures / Tomov, I. / Vassilev, S. -- STRESSES AND STRAINS -- Diffraction analysis of elastic strains in micro- and nanostructures / Thomas, O. -- Determination of residual stress at weld interruptions by neutron diffraction / Turski, M. / Francis, J. A. / Withers, P. J. -- Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation / Dopita, M. / Wüstefeld, Ch. / Klemm, V. / Schreiber, G. / Heger, D. / Růžička, M. / Rafaja, D. -- In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants / Kuru, Y. / Wohlschlögel, M. / Welzel, U. / Mittemeijer, E. J. -- THIN FILMS -- Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction / Birkholz, M. / Darowski, N. / Zizak, I. -- X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry / Klaus, M. / Genzel, Ch. / Holzschuh, H. -- Magnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition / Kužel, R. / Nichtová, L. / Matěj, Z. / Šícha, J. / Musil, J. -- Influence of reactive plasmas on thin nickel films / Quaas, M. / Ivanova, O. / Helm, C. A. / Wulff, H. -- Author Index
• Sommario/riassunto: Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
• Titolo autorizzato: Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
• ISBN: 3-486-99256-2
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996308768403316
• Lo trovi qui: Univ. di Salerno
• Serie: Zeitschrift für Kristallographie. . -Supplement issue ; ; Number 27.