LEADER 15830nam 22018135 450 001 996308768403316 005 20230621140126.0 010 $a3-486-99256-2 024 7 $a10.1524/9783486992564 035 $a(CKB)3710000000497065 035 $a(SSID)ssj0001589845 035 $a(PQKBManifestationID)16285006 035 $a(PQKBTitleCode)TC0001589845 035 $a(PQKBWorkID)14880144 035 $a(PQKB)10044837 035 $a(WaSeSS)IndRDA00057999 035 $a(DE-B1597)451968 035 $a(OCoLC)979739024 035 $a(OCoLC)980274364 035 $a(DE-B1597)9783486992564 035 $a(MiAaPQ)EBC5494133 035 $a(Au-PeEL)EBL5494133 035 $a(OCoLC)1049913186 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/47582 035 $a(EXLCZ)993710000000497065 100 $a20190615d2015 fg 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 00$aFifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials $eGarmisch-Partenkirchen, October 7-9, 2007 210 $cDe Gruyter$d2008 210 1$aBerlin ;$aBoston :$cOldenbourg Wissenschaftsverlag,$d[2015] 210 4$d©2008 215 $a1 online resource (xii, 305 pages) $cillustrations 225 0 $aZeitschrift für Kristallographie / Supplemente ;$v27 300 $aBibliographic Level Mode of Issuance: Monograph 320 $aIncludes bibliographical references. 327 $tFrontmatter --$tPREFACE --$tTable of Contents --$tPLANAR FAULTING --$tDiffraction analysis of layer disorder /$rLeoni, M. --$tPeculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering /$rCherepanova, S. V. / Tsybulya, S. V. --$tNANOCRYSTALLINE MATERIALS --$tInterference phenomena in nanocrystalline materials and their application in the microstructure analysis /$rRafaja, D. / Klemm, V. / Wüstefeld, Ch. / Motylenko, M. / Dopita, M. / Schwarz, M. / Barsukova, T. / Kroke, E. --$tOptimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources /$rRobinson, Ian K. --$tCapacitor discharge sintering of nanocrystalline copper /$rFais, A. / Scardi, P. --$tMicrostructure study on BN nanocomposites using XRD and HRTEM /$rMotylenko, M. / Klemm, V. / Schreiber, G. / Rafaja, D. / Schwarz, M. / Barsukova, T. / Kroke, E. --$tPLASTIC DEFORMATION --$tImpact of dislocation cell elastic strain variations on line profiles from deformed copper /$rLevine, L. E. / Larson, B. C. / Tischler, J. Z. / Geantil, P. / Kassner, M. E. / Liu, W. / Stoudt, M. R. --$tDetermination of stored elastic energy in plastically deformed copper /$rBaczma?ski, A. / Hfaiedh, N. / François, M. / Saanouni, K. / Wierzbanowski, K. --$tStructural studies of submicrocrystalline copper and copper composites by different methods /$rKu?el, R. / Cherkaska, V. / Mat?j, Z. / Jane?ek, M. / ?í?ek, J. / Dopita, M. --$tGrain stresses and elastic energy in ferritic steel under uniaxial load /$rBaczma?ski, A. / Tidu, A. / Lipinski, P. / Wierzbanowski, K. --$tStress and hardness in surface layers of shot-peened steels /$rDrahokoupil, J. / Ganev, N. / ?er?anský, M. / Bohá?, P. / ?tvrtlík, R. / Stranyánek, M. --$tLINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN --$tThe "state of the art" of the diffraction analysis of crystallite size and lattice strain /$rMittemeijer, E. J. / Welzel, U. --$tRecent advancements in Whole Powder Pattern Modelling /$rScardi, P. --$tOn the simulation of the anisotropic peak broadening in powder diffraction /$rZlokazov, V. B. --$tXRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process /$rBorca, E. / Bercu, M. / Georgescu, S. / Hodorogea, S. / Cotoi, E. --$tCumulants and moments in the line profile analysis /$r?er?anský, M. --$tX-ray line-broadening analysis of dislocations in a single crystal of Zr /$rGriffiths, M. --$tXRD line profile analysis of calcite powders produced by high energy milling /$rPesenti, H. / Leoni, M. / Scardi, P. --$tRefining real structure parameters of disordered layer structures within the Rietveld method /$rUfer, K. / Kleeberg, R. / Bergmann, J. / Curtius, H. / Dohrmann, R. --$tMicrostructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation /$rWüstefeld, Ch. / Dopita, M. / Klemm, V. / Heger, D. / Rafaja, D. --$tMATERIALS MICROSTRUCTURE --$tCharacterization of hot wall grown N-9-anthracenylidene-1-anthramine films /$rBedi, R. K. / Brar, S. S. / Kaur, N. / Kumar, S. / Mahajan, A. --$tStructural and optical properties of AgInSe2 films /$rBedi, R. K. / Pathak, D. / Deepak / Kaur, D. --$tIn situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor /$rFilatov, E. / Shubin, Yu. / Sharafutdinov, M. --$tCrystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium /$rHe, D. / Wang, J. Y. / Mittemeijer --$tStructural state of Eu2(MoO4)3 single crystal after different thermobaric treatments /$rKudrenko, E. A. / Shmyt'ko, I. M. / Sinitsyn, V. V. / Ponyatovsky, E. G. / Red'kin, B. N. --$tAnomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods /$rShmytko, I. M. / Kudrenko, E. A. / Strukova, G. K. / Kedrov, V. V. / Klassen, N. V. --$tRefinement of extinction-affected X-ray reflection profile of textures /$rTomov, I. / Vassilev, S. --$tSTRESSES AND STRAINS --$tDiffraction analysis of elastic strains in micro- and nanostructures /$rThomas, O. --$tDetermination of residual stress at weld interruptions by neutron diffraction /$rTurski, M. / Francis, J. A. / Withers, P. J. --$tResidual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation /$rDopita, M. / Wüstefeld, Ch. / Klemm, V. / Schreiber, G. / Heger, D. / R??i?ka, M. / Rafaja, D. --$tIn-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants /$rKuru, Y. / Wohlschlögel, M. / Welzel, U. / Mittemeijer, E. J. --$tTHIN FILMS --$tProfiling of fibre texture gradients in thin films by anomalous X-ray diffraction /$rBirkholz, M. / Darowski, N. / Zizak, I. --$tX-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry /$rKlaus, M. / Genzel, Ch. / Holzschuh, H. --$tMagnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition /$rKu?el, R. / Nichtová, L. / Mat?j, Z. / ?ícha, J. / Musil, J. --$tInfluence of reactive plasmas on thin nickel films /$rQuaas, M. / Ivanova, O. / Helm, C. A. / Wulff, H. --$tAuthor Index 330 $aZeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography. 410 0$aZeitschrift fu?r Kristallographie.$pSupplement issue ;$vNumber 27. 606 $aCosmic physics 606 $aGeophysics 615 0$aCosmic physics. 615 0$aGeophysics. 702 $aBaczma?ski$b A.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aFais$b A.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aMahajan$b A.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aTidu$b A.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aLarson$b B. C.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aRed'kin$b B. 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B.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aKedrov$b V. V.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aSinitsyn$b V. V.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aCherkaska$b V.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aKlemm$b V.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aLiu$b W.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aKuru$b Y.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aShubin$b Yu.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 702 $aMat?j$b Z.$4ctb$4https://id.loc.gov/vocabulary/relators/ctb 801 0$bDE-B1597 801 1$bDE-B1597 906 $aBOOK 912 $a996308768403316 996 $aFifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials$92180568 997 $aUNISA