15830nam 22018135 450 99630876840331620230621140126.03-486-99256-210.1524/9783486992564(CKB)3710000000497065(SSID)ssj0001589845(PQKBManifestationID)16285006(PQKBTitleCode)TC0001589845(PQKBWorkID)14880144(PQKB)10044837(WaSeSS)IndRDA00057999(DE-B1597)451968(OCoLC)979739024(OCoLC)980274364(DE-B1597)9783486992564(MiAaPQ)EBC5494133(Au-PeEL)EBL5494133(OCoLC)1049913186(oapen)https://directory.doabooks.org/handle/20.500.12854/47582(EXLCZ)99371000000049706520190615d2015 fg engur|||||||||||txtccrFifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials Garmisch-Partenkirchen, October 7-9, 2007De Gruyter2008Berlin ;Boston :Oldenbourg Wissenschaftsverlag,[2015]©20081 online resource (xii, 305 pages) illustrationsZeitschrift für Kristallographie / Supplemente ;27Bibliographic Level Mode of Issuance: MonographIncludes bibliographical references.Frontmatter --PREFACE --Table of Contents --PLANAR FAULTING --Diffraction analysis of layer disorder /Leoni, M. --Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering /Cherepanova, S. V. / Tsybulya, S. V. --NANOCRYSTALLINE MATERIALS --Interference phenomena in nanocrystalline materials and their application in the microstructure analysis /Rafaja, D. / Klemm, V. / Wüstefeld, Ch. / Motylenko, M. / Dopita, M. / Schwarz, M. / Barsukova, T. / Kroke, E. --Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources /Robinson, Ian K. --Capacitor discharge sintering of nanocrystalline copper /Fais, A. / Scardi, P. --Microstructure study on BN nanocomposites using XRD and HRTEM /Motylenko, M. / Klemm, V. / Schreiber, G. / Rafaja, D. / Schwarz, M. / Barsukova, T. / Kroke, E. --PLASTIC DEFORMATION --Impact of dislocation cell elastic strain variations on line profiles from deformed copper /Levine, L. E. / Larson, B. C. / Tischler, J. Z. / Geantil, P. / Kassner, M. E. / Liu, W. / Stoudt, M. R. --Determination of stored elastic energy in plastically deformed copper /Baczmański, A. / Hfaiedh, N. / François, M. / Saanouni, K. / Wierzbanowski, K. --Structural studies of submicrocrystalline copper and copper composites by different methods /Kužel, R. / Cherkaska, V. / Matěj, Z. / Janeček, M. / Čížek, J. / Dopita, M. --Grain stresses and elastic energy in ferritic steel under uniaxial load /Baczmański, A. / Tidu, A. / Lipinski, P. / Wierzbanowski, K. --Stress and hardness in surface layers of shot-peened steels /Drahokoupil, J. / Ganev, N. / Čerňanský, M. / Boháč, P. / Čtvrtlík, R. / Stranyánek, M. --LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN --The "state of the art" of the diffraction analysis of crystallite size and lattice strain /Mittemeijer, E. J. / Welzel, U. --Recent advancements in Whole Powder Pattern Modelling /Scardi, P. --On the simulation of the anisotropic peak broadening in powder diffraction /Zlokazov, V. B. --XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process /Borca, E. / Bercu, M. / Georgescu, S. / Hodorogea, S. / Cotoi, E. --Cumulants and moments in the line profile analysis /Čerčanský, M. --X-ray line-broadening analysis of dislocations in a single crystal of Zr /Griffiths, M. --XRD line profile analysis of calcite powders produced by high energy milling /Pesenti, H. / Leoni, M. / Scardi, P. --Refining real structure parameters of disordered layer structures within the Rietveld method /Ufer, K. / Kleeberg, R. / Bergmann, J. / Curtius, H. / Dohrmann, R. --Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation /Wüstefeld, Ch. / Dopita, M. / Klemm, V. / Heger, D. / Rafaja, D. --MATERIALS MICROSTRUCTURE --Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films /Bedi, R. K. / Brar, S. S. / Kaur, N. / Kumar, S. / Mahajan, A. --Structural and optical properties of AgInSe2 films /Bedi, R. K. / Pathak, D. / Deepak / Kaur, D. --In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor /Filatov, E. / Shubin, Yu. / Sharafutdinov, M. --Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium /He, D. / Wang, J. Y. / Mittemeijer --Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments /Kudrenko, E. A. / Shmyt'ko, I. M. / Sinitsyn, V. V. / Ponyatovsky, E. G. / Red'kin, B. N. --Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods /Shmytko, I. M. / Kudrenko, E. A. / Strukova, G. K. / Kedrov, V. V. / Klassen, N. V. --Refinement of extinction-affected X-ray reflection profile of textures /Tomov, I. / Vassilev, S. --STRESSES AND STRAINS --Diffraction analysis of elastic strains in micro- and nanostructures /Thomas, O. --Determination of residual stress at weld interruptions by neutron diffraction /Turski, M. / Francis, J. A. / Withers, P. J. --Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation /Dopita, M. / Wüstefeld, Ch. / Klemm, V. / Schreiber, G. / Heger, D. / Růžička, M. / Rafaja, D. --In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants /Kuru, Y. / Wohlschlögel, M. / Welzel, U. / Mittemeijer, E. J. --THIN FILMS --Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction /Birkholz, M. / Darowski, N. / Zizak, I. --X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry /Klaus, M. / Genzel, Ch. / Holzschuh, H. --Magnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition /Kužel, R. / Nichtová, L. / Matěj, Z. / Šícha, J. / Musil, J. --Influence of reactive plasmas on thin nickel films /Quaas, M. / Ivanova, O. / Helm, C. A. / Wulff, H. --Author IndexZeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.Zeitschrift für Kristallographie.Supplement issue ;Number 27.Cosmic physicsGeophysicsCosmic physics.Geophysics.Baczmański A.ctbhttps://id.loc.gov/vocabulary/relators/ctbFais A.ctbhttps://id.loc.gov/vocabulary/relators/ctbMahajan A.ctbhttps://id.loc.gov/vocabulary/relators/ctbTidu A.ctbhttps://id.loc.gov/vocabulary/relators/ctbLarson B. C.ctbhttps://id.loc.gov/vocabulary/relators/ctbRed'kin B. N.ctbhttps://id.loc.gov/vocabulary/relators/ctbHelm C. A.ctbhttps://id.loc.gov/vocabulary/relators/ctbGenzel Ch.ctbhttps://id.loc.gov/vocabulary/relators/ctbWüstefeld Ch.ctbhttps://id.loc.gov/vocabulary/relators/ctbHe D.ctbhttps://id.loc.gov/vocabulary/relators/ctbHeger D.ctbhttps://id.loc.gov/vocabulary/relators/ctbKaur D.ctbhttps://id.loc.gov/vocabulary/relators/ctbPathak D.ctbhttps://id.loc.gov/vocabulary/relators/ctbRafaja D.ctbhttps://id.loc.gov/vocabulary/relators/ctbDeepakctbhttps://id.loc.gov/vocabulary/relators/ctbKudrenko E. A.ctbhttps://id.loc.gov/vocabulary/relators/ctbPonyatovsky E. G.ctbhttps://id.loc.gov/vocabulary/relators/ctbMittemeijer E. J.ctbhttps://id.loc.gov/vocabulary/relators/ctbBorca E.ctbhttps://id.loc.gov/vocabulary/relators/ctbCotoi E.ctbhttps://id.loc.gov/vocabulary/relators/ctbFilatov E.ctbhttps://id.loc.gov/vocabulary/relators/ctbKroke E.ctbhttps://id.loc.gov/vocabulary/relators/ctbStrukova G. K.ctbhttps://id.loc.gov/vocabulary/relators/ctbSchreiber G.ctbhttps://id.loc.gov/vocabulary/relators/ctbCurtius H.ctbhttps://id.loc.gov/vocabulary/relators/ctbHolzschuh H.ctbhttps://id.loc.gov/vocabulary/relators/ctbPesenti H.ctbhttps://id.loc.gov/vocabulary/relators/ctbWulff H.ctbhttps://id.loc.gov/vocabulary/relators/ctbShmytko I. M.ctbhttps://id.loc.gov/vocabulary/relators/ctbShmyt'ko I. M.ctbhttps://id.loc.gov/vocabulary/relators/ctbTomov I.ctbhttps://id.loc.gov/vocabulary/relators/ctbZizak I.ctbhttps://id.loc.gov/vocabulary/relators/ctbRobinson Ian K.ctbhttps://id.loc.gov/vocabulary/relators/ctbFrancis J. A.ctbhttps://id.loc.gov/vocabulary/relators/ctbWang J. Y.ctbhttps://id.loc.gov/vocabulary/relators/ctbTischler J. Z.ctbhttps://id.loc.gov/vocabulary/relators/ctbBergmann J.ctbhttps://id.loc.gov/vocabulary/relators/ctbDrahokoupil J.ctbhttps://id.loc.gov/vocabulary/relators/ctbMusil J.ctbhttps://id.loc.gov/vocabulary/relators/ctbČížek J.ctbhttps://id.loc.gov/vocabulary/relators/ctbŠícha J.ctbhttps://id.loc.gov/vocabulary/relators/ctbSaanouni K.ctbhttps://id.loc.gov/vocabulary/relators/ctbUfer K.ctbhttps://id.loc.gov/vocabulary/relators/ctbWierzbanowski K.ctbhttps://id.loc.gov/vocabulary/relators/ctbLevine L. E.ctbhttps://id.loc.gov/vocabulary/relators/ctbNichtová L.ctbhttps://id.loc.gov/vocabulary/relators/ctbKassner M. E.ctbhttps://id.loc.gov/vocabulary/relators/ctbStoudt M. R.ctbhttps://id.loc.gov/vocabulary/relators/ctbBercu M.ctbhttps://id.loc.gov/vocabulary/relators/ctbBirkholz M.ctbhttps://id.loc.gov/vocabulary/relators/ctbDopita M.ctbhttps://id.loc.gov/vocabulary/relators/ctbFrançois M.ctbhttps://id.loc.gov/vocabulary/relators/ctbGriffiths M.ctbhttps://id.loc.gov/vocabulary/relators/ctbJaneček M.ctbhttps://id.loc.gov/vocabulary/relators/ctbKlaus M.ctbhttps://id.loc.gov/vocabulary/relators/ctbLeoni M.ctbhttps://id.loc.gov/vocabulary/relators/ctbMotylenko M.ctbhttps://id.loc.gov/vocabulary/relators/ctbQuaas M.ctbhttps://id.loc.gov/vocabulary/relators/ctbRůžička M.ctbhttps://id.loc.gov/vocabulary/relators/ctbSchwarz M.ctbhttps://id.loc.gov/vocabulary/relators/ctbSharafutdinov M.ctbhttps://id.loc.gov/vocabulary/relators/ctbStranyánek M.ctbhttps://id.loc.gov/vocabulary/relators/ctbTurski M.ctbhttps://id.loc.gov/vocabulary/relators/ctbWohlschlögel M.ctbhttps://id.loc.gov/vocabulary/relators/ctbČerčanský M.ctbhttps://id.loc.gov/vocabulary/relators/ctbČerňanský M.ctbhttps://id.loc.gov/vocabulary/relators/ctbMittemeijerctbhttps://id.loc.gov/vocabulary/relators/ctbKlassen N. V.ctbhttps://id.loc.gov/vocabulary/relators/ctbDarowski N.ctbhttps://id.loc.gov/vocabulary/relators/ctbGanev N.ctbhttps://id.loc.gov/vocabulary/relators/ctbHfaiedh N.ctbhttps://id.loc.gov/vocabulary/relators/ctbKaur N.ctbhttps://id.loc.gov/vocabulary/relators/ctbIvanova O.ctbhttps://id.loc.gov/vocabulary/relators/ctbThomas O.ctbhttps://id.loc.gov/vocabulary/relators/ctbWithers P. J.ctbhttps://id.loc.gov/vocabulary/relators/ctbBoháč P.ctbhttps://id.loc.gov/vocabulary/relators/ctbGeantil P.ctbhttps://id.loc.gov/vocabulary/relators/ctbLipinski P.ctbhttps://id.loc.gov/vocabulary/relators/ctbScardi P.ctbhttps://id.loc.gov/vocabulary/relators/ctbBedi R. K.ctbhttps://id.loc.gov/vocabulary/relators/ctbDohrmann R.ctbhttps://id.loc.gov/vocabulary/relators/ctbKleeberg R.ctbhttps://id.loc.gov/vocabulary/relators/ctbKužel R.ctbhttps://id.loc.gov/vocabulary/relators/ctbČtvrtlík R.ctbhttps://id.loc.gov/vocabulary/relators/ctbBrar S. S.ctbhttps://id.loc.gov/vocabulary/relators/ctbCherepanova S. V.ctbhttps://id.loc.gov/vocabulary/relators/ctbTsybulya S. V.ctbhttps://id.loc.gov/vocabulary/relators/ctbGeorgescu S.ctbhttps://id.loc.gov/vocabulary/relators/ctbHodorogea S.ctbhttps://id.loc.gov/vocabulary/relators/ctbKumar S.ctbhttps://id.loc.gov/vocabulary/relators/ctbVassilev S.ctbhttps://id.loc.gov/vocabulary/relators/ctbBarsukova T.ctbhttps://id.loc.gov/vocabulary/relators/ctbWelzel U.ctbhttps://id.loc.gov/vocabulary/relators/ctbZlokazov V. B.ctbhttps://id.loc.gov/vocabulary/relators/ctbKedrov V. V.ctbhttps://id.loc.gov/vocabulary/relators/ctbSinitsyn V. V.ctbhttps://id.loc.gov/vocabulary/relators/ctbCherkaska V.ctbhttps://id.loc.gov/vocabulary/relators/ctbKlemm V.ctbhttps://id.loc.gov/vocabulary/relators/ctbLiu W.ctbhttps://id.loc.gov/vocabulary/relators/ctbKuru Y.ctbhttps://id.loc.gov/vocabulary/relators/ctbShubin Yu.ctbhttps://id.loc.gov/vocabulary/relators/ctbMatěj Z.ctbhttps://id.loc.gov/vocabulary/relators/ctbDE-B1597DE-B1597BOOK996308768403316Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials2180568UNISA