On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev
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| Autore: |
Rumiantsev Andrej
|
| Titolo: |
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev
|
| Pubblicazione: | Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] |
| ©2019 | |
| Edizione: | 1st ed. |
| Descrizione fisica: | 1 online resource (278 pages) |
| Disciplina: | 621.38152 |
| Soggetto topico: | Semiconductors - Characterization |
| Sommario/riassunto: | The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. |
| Titolo autorizzato: | On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond |
| ISBN: | 1-00-333899-2 |
| 1-003-33899-2 | |
| 1-000-79285-4 | |
| 87-7022-111-1 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910793777703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
River Publishers series in electronic materials and devices.