02221nam 2200469 450 991079377770332120230109084715.01-00-333899-21-003-33899-21-000-79285-487-7022-111-1(CKB)4100000008736203(MiAaPQ)EBC5829253(MiAaPQ)EBC30251765(Au-PeEL)EBL30251765(EXLCZ)99410000000873620320190808d2019 uy 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /Andrej Rumiantsev1st ed.Gistrup, Denmark ;Delft, Netherlands :River Publishers,[2019]©20191 online resource (278 pages)River publishers series in electronic materials and devices87-7022-112-X The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug.  This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.River Publishers series in electronic materials and devices.SemiconductorsCharacterizationSemiconductorsCharacterization.621.38152Rumiantsev Andrej1493108MiAaPQMiAaPQMiAaPQBOOK9910793777703321On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond3715966UNINA