LEADER 02221nam 2200469 450 001 9910793777703321 005 20230109084715.0 010 $a1-00-333899-2 010 $a1-003-33899-2 010 $a1-000-79285-4 010 $a87-7022-111-1 035 $a(CKB)4100000008736203 035 $a(MiAaPQ)EBC5829253 035 $a(MiAaPQ)EBC30251765 035 $a(Au-PeEL)EBL30251765 035 $a(EXLCZ)994100000008736203 100 $a20190808d2019 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /$fAndrej Rumiantsev 205 $a1st ed. 210 1$aGistrup, Denmark ;$aDelft, Netherlands :$cRiver Publishers,$d[2019] 210 4$dİ2019 215 $a1 online resource (278 pages) 225 1 $aRiver publishers series in electronic materials and devices 311 $a87-7022-112-X 330 $aThe demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug.  This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. 410 0$aRiver Publishers series in electronic materials and devices. 606 $aSemiconductors$xCharacterization 615 0$aSemiconductors$xCharacterization. 676 $a621.38152 700 $aRumiantsev$b Andrej$01493108 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910793777703321 996 $aOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond$93715966 997 $aUNINA