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2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET) / / Institute of Electrical and Electronics Engineers



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Titolo: 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET) / / Institute of Electrical and Electronics Engineers Visualizza cluster
Pubblicazione: New York : , : IEEE, , 2022
Descrizione fisica: 1 online resource
Disciplina: 005.14
Soggetto topico: Computer software - Testing
Sommario/riassunto: The test oracle problem is one of the most challenging problems in software engineering A growing body of research has examined the concept of Metamorphic Testing (MT), and has proven that MT can effectively alleviate the oracle problem and detect real bugs Compared with most other testing methods, where the correctness of each individual test output is checked, MT has a different perspective on testing it focuses on the relationships among the inputs and outputs of multiple executions of the software under test MET The International Workshop on Metamorphic Testing will bring together researchers and practitioners in academia and industry to discuss research results, experiences, and insights into MT The ultimate goal of MET is to provide a platform for the discussion of novel ideas, new perspectives, new applications, and the state of research, related to or inspired by MT.
Altri titoli varianti: 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing
Titolo autorizzato: 2022 IEEE  Visualizza cluster
ISBN: 1-4503-9307-1
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910645958603321
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