Vai al contenuto principale della pagina
Titolo: |
2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET) / / Institute of Electrical and Electronics Engineers
![]() |
Pubblicazione: | New York : , : IEEE, , 2022 |
Descrizione fisica: | 1 online resource |
Disciplina: | 005.14 |
Soggetto topico: | Computer software - Testing |
Sommario/riassunto: | The test oracle problem is one of the most challenging problems in software engineering A growing body of research has examined the concept of Metamorphic Testing (MT), and has proven that MT can effectively alleviate the oracle problem and detect real bugs Compared with most other testing methods, where the correctness of each individual test output is checked, MT has a different perspective on testing it focuses on the relationships among the inputs and outputs of multiple executions of the software under test MET The International Workshop on Metamorphic Testing will bring together researchers and practitioners in academia and industry to discuss research results, experiences, and insights into MT The ultimate goal of MET is to provide a platform for the discussion of novel ideas, new perspectives, new applications, and the state of research, related to or inspired by MT. |
Altri titoli varianti: | 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing |
Titolo autorizzato: | 2022 IEEE ![]() |
ISBN: | 1-4503-9307-1 |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910645958603321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |