02031nam 2200373 450 991064595860332120230821153811.01-4503-9307-1(CKB)5580000000346224(NjHacI)995580000000346224(EXLCZ)99558000000034622420230821d2022 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET) /Institute of Electrical and Electronics EngineersNew York :IEEE,2022.1 online resource1-66546-230-2 The test oracle problem is one of the most challenging problems in software engineering A growing body of research has examined the concept of Metamorphic Testing (MT), and has proven that MT can effectively alleviate the oracle problem and detect real bugs Compared with most other testing methods, where the correctness of each individual test output is checked, MT has a different perspective on testing it focuses on the relationships among the inputs and outputs of multiple executions of the software under test MET The International Workshop on Metamorphic Testing will bring together researchers and practitioners in academia and industry to discuss research results, experiences, and insights into MT The ultimate goal of MET is to provide a platform for the discussion of novel ideas, new perspectives, new applications, and the state of research, related to or inspired by MT.2022 IEEE/ACM 7th International Workshop on Metamorphic Testing Computer softwareTestingCongressesComputer softwareTestingComputer softwareTestingComputer softwareTesting.005.14NjHacINjHaclPROCEEDING99106459586033212022 IEEE2807321UNINA