LEADER 02031nam 2200373 450 001 9910645958603321 005 20230821153811.0 010 $a1-4503-9307-1 035 $a(CKB)5580000000346224 035 $a(NjHacI)995580000000346224 035 $a(EXLCZ)995580000000346224 100 $a20230821d2022 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET) /$fInstitute of Electrical and Electronics Engineers 210 1$aNew York :$cIEEE,$d2022. 215 $a1 online resource 311 $a1-66546-230-2 330 $aThe test oracle problem is one of the most challenging problems in software engineering A growing body of research has examined the concept of Metamorphic Testing (MT), and has proven that MT can effectively alleviate the oracle problem and detect real bugs Compared with most other testing methods, where the correctness of each individual test output is checked, MT has a different perspective on testing it focuses on the relationships among the inputs and outputs of multiple executions of the software under test MET The International Workshop on Metamorphic Testing will bring together researchers and practitioners in academia and industry to discuss research results, experiences, and insights into MT The ultimate goal of MET is to provide a platform for the discussion of novel ideas, new perspectives, new applications, and the state of research, related to or inspired by MT. 517 $a2022 IEEE/ACM 7th International Workshop on Metamorphic Testing 606 $aComputer software$xTesting$vCongresses 606 $aComputer software$xTesting 615 0$aComputer software$xTesting 615 0$aComputer software$xTesting. 676 $a005.14 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a9910645958603321 996 $a2022 IEEE$92807321 997 $aUNINA