2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006
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| Titolo: |
2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006
|
| Pubblicazione: | [Place of publication not identified], : Electron Devices Society, 2006 |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Reliability |
| Integrated circuits - Reliability - Wafer-scale integration | |
| Electrical & Computer Engineering | |
| Engineering & Applied Sciences | |
| Electrical Engineering | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | 2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 |
| ISBN: | 9781509090969 |
| 1509090967 | |
| 9781424402977 | |
| 1424402972 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910146723603321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |