01984oam 2200529zu 450 991014672360332120241212215545.09781509090969150909096797814244029771424402972(CKB)1000000000525143(SSID)ssj0000395393(PQKBManifestationID)12118412(PQKBTitleCode)TC0000395393(PQKBWorkID)10450559(PQKB)10140547(EXLCZ)99100000000052514320160829d2006 uy engtxtccr2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006[Place of publication not identified]Electron Devices Society2006Bibliographic Level Mode of Issuance: Monograph9781424402960 1424402964 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING99101467236033212006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 20062514867UNINA