Record Nr.

UNINA9910146723603321

Titolo

2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006

Pubbl/distr/stampa


[Place of publication not identified], : Electron Devices Society, 2006

ISBN

9781509090969

1509090967

9781424402977

1424402972

Disciplina

621.3815

Soggetti

Integrated circuits - Reliability

Integrated circuits - Reliability - Wafer-scale integration

Electrical & Computer Engineering

Engineering & Applied Sciences

Electrical Engineering

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph